False pin soldering test device and method

A technology for testing pins and virtual soldering, applied in the field of testing, can solve the problems of high cost of testing equipment, complicated operation and testing process, etc., achieve the effect of convenient support means, and solve the effect of complicated operation and testing process

Inactive Publication Date: 2006-10-18
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The invention provides a device for testing the false soldering of pins, which is used to solve the problem of high cost of special testing instruments at present
[0005] The present invention

Method used

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  • False pin soldering test device and method
  • False pin soldering test device and method
  • False pin soldering test device and method

Examples

Experimental program
Comparison scheme
Effect test

example 1

[0062] Example 1: Use D3 and D4, and judge whether there is a virtual weld through the voltage value.

[0063] S101. Establish a first loop.

[0064] Connect the ground probe 1 and the reference probe 3 at both ends of the first open circuit in the voltmeter device to the selected reference ground 11 and the PCB trace where the reference pin 31 or its solder joint is located to form the first One circuit. see Figure 5 As shown, the first power supply 2, the reference resistor Rx, the protection diode D3 and the equivalent resistor R2 are connected in series in the first loop. Here, the first power supply 2 should select a negative voltage, so that the protection diode D3 is turned on.

[0065] In this way, the voltmeter connected in parallel with the reference resistor Rx will display the reference voltage value.

[0066] S102. Connect to the second circuit including the solder joint of the pin to be tested.

[0067] see Image 6 As shown, on the premise of maintaining ...

example 2

[0074] Example 2: Use D3 and D4, and judge whether there is a virtual weld by the current value.

[0075] S201. Establish a first loop.

[0076] Connect the above-mentioned ground probe 1 and reference probe 3 at both ends of the first open circuit in the ammeter device to the selected reference ground 11 and the PCB trace where the reference pin 31 or its solder joint is located to form a first circuit. see Figure 7 As shown, a first power supply 2 , a reference resistor Rx, an ammeter, a protection diode D3 and an equivalent resistor R2 are connected in series in the first loop. Here, the first power supply 2 should select a negative voltage, so that the protection diode D3 is turned on.

[0077] In this way, the ammeter connected in series with the reference resistor Rx will display the reference current value.

[0078] S202. Connect to the second loop including the solder joint of the pin to be tested.

[0079] see Figure 8 As shown, on the premise of maintaining t...

example 3

[0086] Example 3: Use D1 and D2, and judge whether there is a virtual weld through the voltage value.

[0087] S301. Establish a first loop.

[0088] Connect the ground probe 1 and the reference probe 3 at both ends of the first open circuit in the voltmeter device to the selected reference ground 12 and the PCB trace where the reference pin 31 or its solder joint is located to form the first One circuit. A first power supply 2 , a reference resistor Rx, a protection diode D1 and an equivalent resistor R2 are connected in series in the first loop. Here, the first power supply 2 should select a forward voltage so that the protection diode D1 is turned on.

[0089] In this way, the voltmeter connected in parallel with the reference resistor Rx will display the reference voltage value.

[0090] S302. Connect to the second loop including the solder joint of the pin to be tested.

[0091] On the premise of maintaining the above-mentioned first loop, connect the 5 points of the ...

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PUM

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Abstract

The present invention discloses false pin soldering test device with low cost. One device includes one first opened circuit comprising an earth test lead, one first power source, a reference resistor and a reference test lead connected serially; one second opened circuit comprising the earth test lead, the first power source, one second power source with different voltage and a test lead connected serially; and one voltmeter connected in parallel to the reference resistor. One other test device is also disclosed. The simple method of testing false pin soldering with the devices is also disclosed.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a device and a testing method for testing pin virtual soldering. Background technique [0002] At present, after the IC chip is soldered to the single board, it is usually necessary to test the soldering condition of the IC chip. The short-circuit test of IC pins is relatively simple and can be tested with a multimeter, but the open-circuit test of IC pins requires the use of special testing instruments, such as: online tester, optical detector or X-ray detection. These specialized test instruments are expensive. [0003] When using the above-mentioned special test instruments, some parameter settings need to be performed in advance, and the operation and test process are more complicated, and the requirements for operators are also higher. Contents of the invention [0004] The invention provides a device for testing the false soldering of pins, which is used to solve the pr...

Claims

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Application Information

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IPC IPC(8): G01R31/02G01R31/00
Inventor 李大军陈进文
Owner HUAWEI TECH CO LTD
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