Test Apparatus and test method

Abstract

A test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied is provided. The test apparatus includes a reference voltage applying section that applies the reference voltage to the DUT, wherein the reference voltage defines a voltage level that is to be possessed by an output signal output from the DUT when the output signal indicates a predetermined logical value, a voltage level detecting section that detects a voltage level of the reference voltage, a signal comparing section that compares the output signal with an expected value signal, a reference voltage comparing section that judges whether the voltage level of the reference voltage detected by the voltage level detecting section falls within a predetermined expected voltage range, and a judging section that judges whether the DUT is good or bad based on a result of the comparison done by the signal comparing section, under a condition that the voltage level of the reference voltage falls within the expected voltage range.

Description

CROSS REFERENCE TO RELATED APPLICATION [0001] The present application claims priority from a Japanese Patent Application(s)NO. 2006-023272 filed on Jan. 31, 2006, the contents of which are incorporated herein by reference. BACKGROUND [0002] 1. Technical Field [0003] The present invention relates to a test apparatus and a test method to test a device under test (DUT). More particularly, the present invention relates to a test apparatus and a test method to test a DUT to which a reference voltage of a predetermined high voltage is supplied. [0004] 2. Related Art [0005] In recent years, the demand for High Voltage Integrated Circuit (HVIC) that outputs a signal with a high voltage has been on the rise. The HVIC is used in a motor controlling device of an electric vehicle, for example. [0006] The HVIC is a device outputting a signal that has a predetermined amplitude with, for example, approximately 0 to 2 kV being used as a reference voltage level. To test the HVIC, a test apparatus su...

AI Technical Summary

Benefits of technology

[0009] To solve the foregoing problem, a first embodiment of the present invention provides a test apparatus to test a device under test (DUT) to which a reference voltage of a predetermined high voltage is supplied. The test apparatus includes a reference voltage applying section that applies the reference voltage to the DUT, wherein the reference voltage defines a voltage level that is to be possessed by an output signal output from the DUT when the output signal indicates a predetermined logical value, a voltage level detecting section that detects a voltage

Problems solved by technology

If the test apparatus does not apply a normal reference voltage to the HVIC, the test apparatus can not accurately measure the level of the output signal from the HVIC.

A conventional test apparatus does not have means for measuring a reference voltage of a high voltage, and therefore can not accurately test a DUT.

This indicates a high cost.

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