Crash sensor and method for processing at least one measuring signal

Abstract

In a crash sensor and a method for processing a measured value of the crash sensor, at least one measured quantity is detected by a sensor element and a first rewritable memory is provided in which first data for influencing the processing of the at least one measured quantity are stored. In addition, a second hardwired memory is provided in which second data for influencing the processing are stored. A logic module is provided which loads the first or second data, as a function of a test of the first memory, for processing the at least one measured quantity.

Description

FIELD OF THE INVENTION[0001]The present invention relates to a crash sensor and a method for processing at least one measuring signal.BACKGROUND INFORMATION[0002]DE 102 37 162 describes a sensor element which delivers a measured value, which is amplified and digitized. This measured value is subjected to pre-processing.SUMMARY[0003]The crash sensor according to example embodiments of the present invention and the method according to example embodiments of the present invention for processing at least one measuring signal having the features described herein have the advantage over conventional arrangements in that a rewritable memory, preferably an EEPROM, is tested and a decision is made, as a function of this memory test, as to the memory from which the data are loaded to influence the processing of the at least one measured value. This allows, in the event of a failure of the rewritable memory, the use of hardwired data which results in reduced accuracy of the measured values but...

AI Technical Summary

Benefits of technology

[0003]The crash sensor according to example embodiments of the present invention and the method according to example embodiments of the present invention for processing at least one measuring signal having the features described herein have the advantage over conventional arrangements in that a rewritable memory, preferably an EEPROM, is tested and a decision is made, as a function of this memory test, as to the memory from which the data are loaded to influence the processing of the at least one measured value. This allows, in the event of a failure of the rewritable memory, the use of hardwired data which results in reduced accuracy of the measured values but still ensures basic functionality of the crash sensor in such critical sensors. The reliability performance, for example, of an occupant protection system is thus decisively enhanced.

[0016]It is furthermore advantageous that rapid offset regulation is used in an initial phase to eliminate the offset of the sensor element itself, a so-called raw offset. In a cyclic phase, i.e., in the actual working phase of the sensor, a slow offset regulation is used for eliminating a drift which often occurs in semiconductor elements. An offset regulation is a simple regulating circuit whose speed may be influenced in a known manner. This regulation may be performed by software and / or hardware. The initial phase is the startup phase of the sensor, while the cyclic phase, as indicated above, is the working phase of the sensor.

Problems solved by technology

This allows, in the event of a failure of the rewritable memory, the use of hardwired data which results in reduced accuracy of the measured values but still ensures basic functionality of the crash sensor in such critical sensors.

When saving and transmitting binary data, individual bits may become corrupted by interference.

By appending more than one check bit, the error recognition rate may be drastically increased.

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