Method and apparatus for multizone plasma generation

Abstract

Embodiments of the present invention provide a method and apparatus for plasma processing a substrate to form a film on the substrate and devices disposed thereon by controlling the ratio of ions to radicals in the plasma at a given pressure. A given pressure may be maintained to promote ion production using one plasma source, and a second plasma source may be used to provide additional radicals. In one embodiment, a low pressure plasma is generated in a processing region having the substrate positioned therein, and a high pressure plasma is generated in separate region. Radicals from the high pressure plasma are injected into the processing region having the low pressure plasma, thus, altering the natural distribution of radicals to ions at a given operating pressure. The resulting process and apparatus enables tailoring of the ion to radical ratio to allow better control of forming films on high aspect ratio features, and thus improve corner rounding, conformality of sidewall to bottom trench growth, and selective growth.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application claims benefit of U.S. provisional patent application Ser. No. 61 / 443,066, filed Feb. 15, 2011, which is herein incorporated by reference.BACKGROUND OF THE INVENTION[0002]1. Field of the Invention[0003]Embodiments of the present invention generally relate to a method and apparatus for plasma processing of substrates, and more particularly, to film formation on a substrate or devices disposed thereon by controlling the ratio of ions and radicals in the plasma using multizone plasma generation.[0004]2. Description of the Related Art[0005]As logic devices continue to scale down according to Moore's Law, processing challenges develop. As critical dimensions of such devices shrink, the geometry of the various components becomes more challenging for manufacturers. Aspect ratios rise and uniformity, tolerance, and reliability issues proliferate. Additionally, issues involving corner rounding, bottom to side trench growth conform...

AI Technical Summary

Problems solved by technology

As logic devices continue to scale down according to Moore's Law, processing challenges develop.

As critical dimensions of such devices shrink, the geometry of the various components becomes more challenging for manufacturers.

Aspect ratios rise and uniformity, tolerance, and reliability issues proliferate.

Additionally, issues involving corner rounding, bottom to side trench growth conformality, and selective growth, which are affected by the natural distribution of ions and radicals within plasma at a given pressure, are prominent.

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