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Semiconductor device sorting system and semiconductor device

a sorting system and semiconductor technology, applied in sorting, semiconductor devices, semiconductor/solid-state device details, etc., can solve the problem that two-dimensional codes cannot be provided with a plurality of characteristic data pieces, and achieve the effect of reducing the amount of data

Active Publication Date: 2019-04-04
MITSUBISHI ELECTRIC CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

The patent text suggests that by categorizing the electrical characteristics of a semiconductor device, the amount of data can be reduced and the device provided with information about its multiple electrical characteristics. This helps in improving the efficiency and design of the semiconductor device.

Problems solved by technology

Considered accordingly is a method of directly providing the two-dimensional code with the characteristic data as a method of simply achieving the above needs, however, the two-dimensional code with which the semiconductor device can be provided has a small data capacity, so that there is a problem that the two-dimensional code cannot be provided with a plurality of pieces of the characteristic data.

Method used

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  • Semiconductor device sorting system and semiconductor device
  • Semiconductor device sorting system and semiconductor device
  • Semiconductor device sorting system and semiconductor device

Examples

Experimental program
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Effect test

embodiment 1

[0022]The embodiment 1 of the present invention is described hereinafter using the drawings. FIG. 1 is a block diagram of a semiconductor device sorting system 10 according to the embodiment 1. FIG. 2 is a front view of a semiconductor device 1 sorted by the semiconductor device sorting system 10. FIG. 3 is a front view of the semiconductor device 1. FIG. 4 is a drawing illustrating a determination example of a rank. FIG. 5 is a drawing illustrating a correspondence table between a rank and rank information. FIG. 6 is a drawing illustrating a table in which ranks and pieces of rank information of a plurality of electrical characteristics of each semiconductor device 1 are described.

[0023]As illustrated in FIG. 1, the semiconductor device sorting system 10 includes a rank determination database 2, a calculation unit 3, a characteristic measurement unit 4, a writing unit 5, a reading unit 6, and a sorting unit 7.

[0024]The characteristic measurement unit 4, which is a semiconductor tes...

modification example of embodiment 1

[0039]Next, the modification example of the embodiment 1 is described. FIG. 9 is a flow chart of writing processing of the rank information according to the modification example of the embodiment 1. As illustrated in FIG. 9, in the modification example 1 of the embodiment 1, a storage process for grasping a total number of stocks for each rank is added after the graphic symbolic code is marked on the semiconductor device 1 in the writing processing of the rank information.

[0040]Next, the writing processing of the rank information is described with reference to FIG. 9. The steps of Step S1 to Step S3 are performed in the manner similar to the case of FIG. 7, and the storage process is performed in the next Step S4. In the storage process, the calculation unit 3 records the number of stocks of the semiconductor device 1 for each rank of the electrical characteristics in a memory of the calculation unit 3, for example, thereby finishing the writing processing. The semiconductor device ...

embodiment 2

[0042]Next, a semiconductor device sorting system 10A according to the embodiment 2 is described. FIG. 10 is a block diagram of the semiconductor device sorting system 10A according to the embodiment 2. FIG. 11 is a flow chart of sorting processing of the semiconductor device 1. The same reference numerals as those described in the embodiment 1 will be assigned to the same element in the embodiment 2, and a repetitive description is omitted.

[0043]In the embodiment 2, the semiconductor device 1 is sorted based on a plurality of ranks being read from the graphic symbolic code and ranks of requested characteristics requested from the user of the semiconductor device.

[0044]As illustrated in FIG. 10, the semiconductor device sorting system 10A includes the rank determination database 2, calculation units 3a and 3b, the characteristic measurement unit 4, the writing unit 5, the reading unit 6, the sorting unit 7, and a requested characteristic input unit 8. The calculation units 3a and 3b...

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Abstract

It is an object to provide a technique capable of providing a semiconductor device with information indicating a plurality of electrical characteristics. A semiconductor device sorting system includes a characteristic measurement unit measuring electrical characteristics of a semiconductor device, a rank determination database for classifying the electrical characteristics into ranks, a calculation unit classifying the plurality of electrical characteristics of the semiconductor device measured by the characteristic measurement unit into a plurality of ranks with reference to the rank determination database, a writing unit converting the plurality of ranks classified by the calculation unit into a graphic symbolic code and forming the graphic symbolic code on the semiconductor device, a reading unit reading the plurality of ranks from the graphic symbolic code formed on the semiconductor device, and a sorting unit sorting the semiconductor device based on the plurality of ranks being read by the reading unit.

Description

BACKGROUND OF THE INVENTIONField of the Invention[0001]The present invention relates to a semiconductor device sorting system.Description of the Background Art[0002]Semiconductor devices are sorted using predetermined characteristic data indicating electrical characteristics of semiconductor devices in a shipping process to ship a semiconductor device which matches needs of a client.[0003]Japanese Patent Application Laid-Open No. 11-26333 describes a method of sorting a product by providing a two-dimensional code with only ID data and reading out characteristic data stored in a database on a system from the ID data.[0004]However, a conventional method as Japanese Patent Application Laid-Open No. 11-26333 needs maintenance and an operation of a system of referring to the database based on the ID data of the two-dimensional code to know the electrical characteristics of the product. Considered accordingly is a method of directly providing the two-dimensional code with the characterist...

Claims

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Application Information

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IPC IPC(8): H01L21/67H01L23/544B07C5/34
CPCH01L21/67271H01L23/544B07C5/3412H01L2223/5442B07C5/344H01L21/67294H01L2223/54486H01L2223/54433
Inventor YOKOYAMA, SHUHEIHASEGAWA, MAKINAKAMURA, HIROYUKIMORI, SHIGERUIWAGAMI, TORU
Owner MITSUBISHI ELECTRIC CORP