The application provides a
nanosecond micro-impulse generation method for
chip electrostatic tolerance, relates to the technical field of detection systems, and establishes a low-energy
linear channel model and a segmented
nonlinear channel model of a triggered electrostatic protection clamp for a target test port of a measured
chip, discretely decomposes a pre-
distortion excitation instruction into a charge packet sequence containing a charge amount parameter, an
energy parameter and a
release time parameter, injects and forms a
nanosecond micro-impulse waveform according to the
release time, performs
wideband sampling on port
voltage and current, obtains an actual port waveform based on double-
model inversion compensation, calculates an error, and updates the charge packet sequence in a
closed loop until convergence output is obtained, meanwhile, port impedance and leakage response criterion extraction are realized through a pre-
processing section, a main impulse section and a latch detection section, which are used for distinguishing
soft breakdown and hard breakdown and generating a multi-port
sensitivity distribution, and the method has the characteristics of controllable, reproducible and traceable waveform.