Dipper double stars system based fast method for detecting carrier status

A double-star and Beidou technology, applied in the field of carrier measurement using the Beidou double-star system, can solve the problems of accurate measurement of baseline rotation angle, rapidity and accuracy of carrier attitude measurement, long and short baselines are not easy to be in the same direction, etc., to achieve accurate azimuth Angle and pitch angle, attitude calculation speed is fast, and the effect of simple measurement device

Inactive Publication Date: 2010-03-10
NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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Problems solved by technology

However, there are certain deficiencies in practical applications. For example, the rotating baseline method requires the baseline to be orthogonal to the rotation axis, and the baseline rotation angle needs to be accurately measured; the long and short baselines are not easy to be in the same direction when multi-antenna configurations are used. These factors are likely to affect the rapidity of carrier attitude measurement. affect the accuracy

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  • Dipper double stars system based fast method for detecting carrier status
  • Dipper double stars system based fast method for detecting carrier status
  • Dipper double stars system based fast method for detecting carrier status

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Embodiment 1

[0051] Embodiment 1: as figure 1 , figure 2 As shown, the method for quickly measuring the attitude of the carrier based on the Beidou binary system of the present embodiment includes the following steps:

[0052] (1) At the initial time t 0 , place antenna 1 and antenna 2 along the direction to be measured, so that the antenna baseline direction is parallel to or in the same direction as the measurement direction, and then measure the baseline vector The length L=4m, t 0 The first set of carrier phase observations at time They are the carrier phase single-difference observations of antenna 1 and 2 relative to Beidou satellite 1 and 2, and the unit vector of the line-of-sight direction between antenna 1 and Beidou satellite 1 and 2

[0053] (2) at t 1 time, move the antenna 2 along the direction of the original baseline to extend the baseline length described in step (1) to the original k 1 = 1.5 times, get a new baseline vector Measured at the new baseline vect...

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Abstract

This invention discloses one method based on Big double star system rapid measurement pose, which comprises the following steps: at initial time t0, putting antenna one and two along the measurement direction needed to get the vector r(t0) length L and t0 first set load wave phase observation values; changing the original moving base line length as k1 times along base line direction to get the newvector k1r(t0) to get second set of load wave phase valuesDeltphi<112(t1),Deltphi<212(t1); getting several groups of observations to get the direction angle phi and pitching angle thetato fulfill the measurement.

Description

1. Technical field [0001] The invention relates to a method for measuring the attitude of a carrier, in particular to a method for measuring the carrier by using the Beidou double star system. 2. Background technology [0002] The attitude measurement under the Beidou dual-star system is an important application field of the Beidou navigation system. The attitude is obtained by solving the receiver antenna baseline vector in the navigation coordinate system through the satellite carrier phase information. The core problem is the solution of the ambiguity of the whole circle. Due to the small number of satellites in the current Beidou navigation system, it is difficult to implement the method of solving the ambiguity of the whole circle commonly used in the GPS navigation system, such as the least square search, under the Beidou dual-star system. At present, the attitude measurement methods and related systems developed in China use the rotating baseline (Lu Liangqing, Hu Xia...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01S5/02G01S19/54
Inventor 康国华刘建业曾庆化赖际舟孙永荣赵伟熊智李荣冰
Owner NANJING UNIV OF AERONAUTICS & ASTRONAUTICS
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