Parallel connection burning testing system

A test system and port technology, applied in the field of testing, can solve problems such as limited PCI slots, increased equipment costs, and space configuration problems

Inactive Publication Date: 2007-08-01
诚瑞科技股份有限公司
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  • Abstract
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Problems solved by technology

[0005] However, because the PCI slots on the motherboard 10 are limited, they cannot be increased without limit, and the number of connection ports provided by a single adapter 14 also has a limit (8 at present). If a single circuit board is used, 8 hosts must be installed, and a single operator must monitor 8 screens at the same time, which not only increases the cost of equipment, but also causes troubles in space configuration, and undoubtedly increases the chance of errors

Method used

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Embodiment Construction

[0024] The technical content, features and achieved effects of the present invention will be clearly shown in the following detailed description with accompanying drawings and corresponding preferred embodiments.

[0025] The structure of the first preferred embodiment of this case is shown in Figure 2, including a host computer 2, a display device 3, an input device 4, and a plurality of digital signal transmitters. The host 2 has a casing 20, and in this example, the casing 20 of the host 2 is provided with, for example, four motherboards in parallel, including a control circuit board 21 and three controlled circuits communicating through an Ethernet network 23 plate 22.

[0026] For the sake of illustration, FIG. 3 only takes the three-dimensional relationship of one of the controlled circuit boards 22 , the PCI interface card 25 , the adapter 26 and the circuit board 28 to be processed as an example. Each main board all has PCI slot 24, and is inserted with the control de...

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Abstract

This invention relates to parallel burst recording and test system which expresses each connection place status through one operation circuit board and controlled circuit board interacting to simplify device and operation means, wherein, the machine self has large spring only in need of single machine to allow batch operations to meet large volume production needs.

Description

technical field [0001] The invention relates to the testing field, and relates to a programming test system, in particular to a parallel programming testing system. Background technique [0002] With the increase in the number of integrated components in large-scale integrated circuits (VLSI), the pins of semiconductor components have increased significantly, so BGA (ball grid array) packaging and other structures have to be used, and multi-layer printed circuit boards (MPCB) ), weld the joints to the joints. However, hidden contacts mean that the previous direct contact cannot be used for testing. In order to solve this testing problem, someone proposed a boundary scan (boundary scan) testing technology, which was established by the IEEE Association as the IEEE 1149.1 standard. Through the input and output pins and internal logic The boundary scan unit added between the circuits achieves real-time monitoring of the state of the chip pins, making the boundary scan technolog...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/28H01L21/66H01L27/10
Inventor 彭国展
Owner 诚瑞科技股份有限公司
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