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Peltier element drive method and circuit, peltier module attaching structure, and electronic component handling device

A Peltier element and mounting structure technology, applied in the field of electronic component processing devices, can solve problems such as pressure application, shortened life of Peltier elements, and decreased resistance, and achieve the effect of maintaining life

Inactive Publication Date: 2008-01-16
ADVANTEST CORP
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] However, in the mounting structure of the Peltier module as described above, a very large pressure is continuously applied to the Peltier element sandwiched between the substrates of the Peltier module.
In this way, it is generally believed that if excessive pressure is continuously applied to the Peltier element, the resistance to thermal stress caused by cooling and heating will decrease, and the life of the Peltier element will be shortened.

Method used

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  • Peltier element drive method and circuit, peltier module attaching structure, and electronic component handling device
  • Peltier element drive method and circuit, peltier module attaching structure, and electronic component handling device
  • Peltier element drive method and circuit, peltier module attaching structure, and electronic component handling device

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Embodiment Construction

[0038] Embodiments of the invention will be described in detail below with reference to the drawings.

[0039] 〔Peltier element drive circuit〕

[0040] Fig. 1 is a structural diagram of a Peltier element driving circuit related to an embodiment of the present invention, and Fig. 2 is a pulse voltage provided to a Peltier element by using the Peltier element driving circuit of the same embodiment. graph of the temperature transition.

[0041] The Peltier element driving circuit of the present embodiment comprises: a PWM cycle generation circuit C1; a sawtooth wave generation circuit C2 connected to the PWM cycle generation circuit C1; a current change rate generation circuit C3; a reference circuit connected to the current change rate generation circuit C3 voltage conversion circuit C4; voltage comparator C5 connected to sawtooth wave generation circuit C2 and reference voltage conversion circuit C4; transistor switch C6 connected to voltage comparator C5 and Peltier module 30...

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Abstract

Provided is an impulse width control unit and a switch. The impulse width control unit processes the increase / decrease control to the impulse width of the impulse signal to make the temperature alternation of the Peltier element not exceed the given temperature gradient. The switch processes an on / off control to the drive current applying to the Peltier element based on the impulse signal of the impulse width controlled by the impulse width control unit to inhibit the current rate of change of the power applying to the Peltier element. Therefore, the invention can inhibit sharp alteration of the expansion ratio and shrinkage of the Peltier element at respective portion and reduce the stress applied on the Peltier element. Thus, the Peltier element can be maintained a long service.

Description

technical field [0001] The present invention relates to a driving method and a driving circuit of a Peltier element, a mounting structure of a Peltier module, and an electronic component handling device including a pusher with a Peltier module. Background technique [0002] The driving control of the Peltier element as a cooling / heating element is usually performed by turning on / off a DC power supply. However, if the drive control is performed by turning ON / OFF of the DC power supply, current flows through the Peltier element at once, whereby the temperature of the Peltier element changes rapidly, and temperature stress is applied to the element structure. Since the temperature difference between one surface (cooling surface) and the other surface (radiation surface) of the Peltier element becomes, for example, 50° C. or more, the temperature stress caused by a sudden temperature change tends to deteriorate the performance of the element. This has a problem that the life of...

Claims

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Application Information

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IPC IPC(8): H01L35/28F25B21/02H10N10/10
Inventor 桥本隆志
Owner ADVANTEST CORP
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