Ceramic double arrange packaging device high accelerate centrifugation experiment cramping apparatus

A technology for packaging devices and centrifugal tests, which is applied to centrifuges, instruments, measuring devices, etc., can solve problems such as no layered design of the force-bearing surface of the fixture, difficulty in device positioning, and device failure, so as to avoid the problem of device deformation or fracture, The effect of improving the success rate and production efficiency and reducing the probability of device breakage

Inactive Publication Date: 2008-03-05
NO 24 RES INST OF CETC
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The special fixture provided by the manufacturer has the following disadvantages: 1) The fixture has poor versatility and is expensive; 2) Since the magnetic rubber or built-in rubber is generally used, the metal cover plate is prone to deformation and the ceramic device body is prone to deformation during high-acceleration centrifugal tests. Fracture, resulting in device failure; 3) Only one-way centrifugal test can be carried out, and multi-directional centrifugal test cannot be carried out
The utility model patent No. 99214208.3 introduces a fixture for centrifugal test devices, but it has the following disadvantages when applied to DIP devices: 1) Since there is no layered design on the force-bearing surface of the fixture, it is easy to cause metal cover plate depression and DIP device body Fracture; 2) When clamping the DIP device, the clamping is inconvenient, and it is difficult to position the device in the fixture; 3) Only one-way centrifugal test can be performed, and multi-directional centrifugal test cannot be performed

Method used

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  • Ceramic double arrange packaging device high accelerate centrifugation experiment cramping apparatus
  • Ceramic double arrange packaging device high accelerate centrifugation experiment cramping apparatus

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Embodiment Construction

[0025] The structure and use of the present invention will be further described in detail below in conjunction with the accompanying drawings.

[0026] The high-acceleration centrifugal test fixture of the present invention adopts a method of inserting a "child-and-mother type combined fixture" into the sliding groove of the metal ring rotor. The mother fixture is a standard-volume block shape with built-in standard through slots; the sub-fixture is a drawer-type shape, which can be designed as a sub-fixture of different sizes according to the specific dimensions of the device. After the components are installed, the sub-fixture is directly placed in the through slot of the mother fixture. After the two sides are locked, a plate-like whole is formed, which can be installed in the chute of the metal ring rotor in any direction.

[0027] The high-acceleration centrifugal test fixture of the present invention includes a mother fixture 1, a sub fixture 2 for holding the device to be t...

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Abstract

The fixture comprises a mother fixture, a daughter fixture used for placing the test piece, a fastening used for fastening the test piece and a fastening clamp plate. Said mother fixture has a through slot used for mounting the said daughter fixture by using a drawer way; on the side wall of the mother fixture there are screw type locking components.

Description

(1) Technical field [0001] The invention relates to a high-acceleration centrifugal test fixture for ceramic double-row packaged devices, which is suitable for high-acceleration (≥5000g) centrifugal test of ceramic double-row packaged (DIP) devices. (2) Background technology [0002] The integrated circuit centrifugal test is one of the indispensable test items for assessing the packaging of components, inner lead bonding, chip adhesion and mechanical strength. Ceramic dual-in-line package (DIP) devices are the most common package type in the component category. This category of devices includes three types of spans: small (7.62mm), medium (10.16mm), and large (15.24mm). The centrifugal test of this kind of device mainly adopts two methods: buried sand and clamp. [0003] The sand burying method is to put the test device into a metal box filled with quartz sand, and then put the metal box into the centrifuge ring rotor for testing. The advantage of this test method is that the te...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N19/04B04B15/00
Inventor 胡波蒋殷贵张锋
Owner NO 24 RES INST OF CETC
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