Test approach and device for command line interface

Abstract

The invention provides a test method for command line interface and a device thereof; the method includes the following procedures: firstly, an aggregation command which needs to be tested is acquired; secondly, from the beginning of the root node of the aggregation command, the aggregation command is made the equivalence binary tree conversion; thirdly, the leaf node of the equivalence binary tree undergoes traverse, the route between the leaf node and the root node is accessed, each single command and the expectation prompting message corresponding to the single command are acquired; fourthly, each single command is tested. By the equivalence binary tree conversion, the structure of the command tree is simplified; moreover, the constructed command tree is easy to test, thereby enhancing the testability, reducing the waste of computing resource of equipment and greatly improving the test efficiency.

Description

technical field [0001] The invention relates to the field of equipment testing, in particular to a testing method and device for a network equipment command line interface. Background technique [0002] A command line interface (Command Line Interface, CLI) is a main operation mode for setting current network devices. With the increasingly perfect functions of network devices, the content of the command line is also constantly enriched. When using the command line interface to operate the network device, it is often encountered multi-view, multi-user level command line interface, and different views or different The command tests that can be performed by the user-level command line interface are not the same, and there can be thousands of commands at every turn, and the combination of different meanings between commands can even reach as many as hundreds of thousands. Or change, there will be a replacement of old and new commands in the system equipment, which puts forward ...

AI Technical Summary

Problems solved by technology

[0007] To sum up, in the process of realizing the present invention, the inventor found that there are at least the following problems in the prior art: According to the command format and command tree in the prior art Structure, when the device is performing command testing, it needs to consume more system resources to realize the test calculation process. At the same time, when the number of commands is large, the test efficiency is also very low, which cannot meet the testing requirements of system upgrades or changes.

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