Assembly line type D/A convertor capable of calibrating capacitance mismatch and finite gain error
Patent Information
- Authority / Receiving Office
- CN · China
- Patent Type
- Applications(China)
- Current Assignee / Owner
- EMENSA TECH CO LTD
- Publication Date
- 2008-07-16
- Estimated Expiration
- Not applicable · inactive patent
Smart Images
Figure 1 Figure 2 Figure 3
Abstract
Description
technical field
[0001] The invention belongs to the technical field of analog-to-digital converters, and in particular relates to a pipelined analog-to-digital converter using a low-gain amplifier. Background technique
[0002] An analog-to-digital converter (ADC) is a component that converts an analog signal into a digital signal, that is, digitizes the analog signal. In high-speed analog-to-digital converters, the fastest reported so far is the all-parallel (flash) structure. However, an analog-to-digital converter based on a fully parallel structure requires a large number of extremely accurate and fast comparators, which will consume a large amount of chip area and power. Among the many analog-to-digital converter structures, many can overcome the shortcomings of the all-parallel structure of the analog-to-digital converter, and the pipeline structure is one of them. Moreover, the pipeline architecture provides a better trade-off between speed, accuracy, power consumpt...