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One-chip visible light/infrared light bi-spectrum focal plane detector

A focal plane detector and visible light technology, applied in the field of detectors, can solve problems such as affecting image clarity, and achieve the effect of improving detection capability and reducing volume

Inactive Publication Date: 2008-07-30
THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Due to the influence of this position deviation, the two images cannot be completely overlapped, which will affect the clarity of the image after signal fusion

Method used

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  • One-chip visible light/infrared light bi-spectrum focal plane detector
  • One-chip visible light/infrared light bi-spectrum focal plane detector
  • One-chip visible light/infrared light bi-spectrum focal plane detector

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0029] Referring to accompanying drawing 3, a kind of monolithic visible light / infrared light dual-spectrum focal plane detector, it comprises: visible light pixel 1, visible light pixel collecting diode 2, infrared sensitive pixel 3, infrared sensitive pixel collecting diode 4, The electrodes V1, V2, V3, and V4 on the four-phase CCD transfer grid 5 are arranged in the above order from top to bottom to form a CCD channel; side, and the positions of the visible light pixel 1 and the infrared photosensitive pixel 3 are interchangeable; and infrared signals are input to the corresponding electrodes on the four-phase CCD transfer gate 5; each device is isolated by trench resistance 6 to prevent mutual interference between signals.

[0030] Since the device uses a three-level working mode to output signals, the corresponding electrodes of the photosensitive diode (visible light pixel 1) and PtSi diode (infrared photosensitive pixel 3) and V-CCD channel 11 are respectively V1 and V3...

Embodiment 2

[0038] The difference between embodiment 2 and embodiment 1 is that the positions of the visible light pixel 1 and the infrared photosensitive pixel 3 are exchanged, and the infrared photosensitive pixel collecting diode 4 outputs the infrared signal to the electrode V1, and the visible light pixel collects The diode 2 outputs the visible light signal to the electrode V3, and the rest of the structure is changed accordingly; after this change, its working principle and process are similar to those of the first embodiment.

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Abstract

The invention discloses a single chip type focal plane detector with double spectrum of visible light / infrared light, which comprises a visible light pixel, a visible light pixel collecting diode, an infrared sensitization pixel, an infrared sensitization pixel collecting diode and electrodes V1, V2, V3, V4 on a four-phase CCD transfer bar, wherein, each electrode aligns from top to bottom in turn to form a CCD signal channel, the visible light pixel 1 and the infrared sensitization pixel 3 are juxtaposed on one side of the four-phase CCD transfer bar, and the position of the visible light pixel 1 can be interchanged with the position of the infrared sensitization pixel 3. The visible light pixel 1 and the infrared sensitization pixel 3 respectively input a visible light signal and an infrared signal to corresponding electrodes on the four-phase CCD transfer bar by the infrared sensitization pixel collecting diode and the visible light pixel collecting diode , and each element is insulated by a gutter resistor, thereby preventing mutual interference between signals. The structure of the invention can realize the detection of the double spectrum on the single chip, and the invention has the advantages that: the volume, the weight and the cost of a detection system can be reduced greatly, the invention is compatible with prior silicon techniques, a large-scale focal plane array is easily manufactured, the amalgamation and the separation of real-time pictures are realized in a same optical path, and the detection ability of the detector is improved in a double wave band.

Description

technical field [0001] The invention relates to a detector, in particular to a single-chip visible light / infrared light dual-spectrum focal plane detector. Background technique [0002] At present, most visible light / infrared camera systems use a separate system of visible light and infrared detectors, that is, the visible light detection part based on the visible light charge-coupled device (CCD) and the infrared light detection part based on the infrared focal plane. [0003] The working process of the above-mentioned separate camera system is as follows: when the system detects the target, the visible light detection system and the infrared detection system simultaneously image the target, and the corresponding visible light or infrared image can be observed in the corresponding detection system; and the signal at the back end The processing system can perform fusion processing on the visible light and infrared signals detected by the front end to obtain a dual-band signa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J5/10G01J1/42
Inventor 熊平李立鲍峰李华高李平李仁豪唐遵烈翁雪涛
Owner THE 44TH INST OF CHINA ELECTRONICS TECH GROUP CORP