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Monochromatic x-ray micro beam for trace element mapping

An x-ray, monochromatic technology used in the field of x-ray optics

Inactive Publication Date: 2011-07-27
X-RAY OPTICAL SYSTEM INC
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Problems solved by technology

[0009] The monochromator optics (e.g., hyperbolic crystals) discussed in the above-incorporated U.S. patent applications are capable of achieving small spot sizes, but typically at the expense of aperture size, and (essentially the devices that image the source) serve as x-ray sources function of spot size, it may be too large

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  • Monochromatic x-ray micro beam for trace element mapping
  • Monochromatic x-ray micro beam for trace element mapping
  • Monochromatic x-ray micro beam for trace element mapping

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[0026] In x-ray analysis systems, high x-ray beam intensity and small beam spot size are important in order to reduce sample exposure time, increase spatial resolution and thus improve signal-to-background ratio and overall quality of x-ray analysis measurements. In the past, expensive and powerful x-ray sources such as rotating anode x-ray tubes or synchrotrons were the only available options for producing high-intensity x-ray beams. Recently, developments in x-ray optics have enabled the collection of diverging radiation from x-ray sources by focusing the x-rays. The combination of x-ray focusing optics and a small low power x-ray source can produce an x-ray beam with an intensity comparable to that obtained by more expensive equipment. Thus, a system based on a combination of a small, inexpensive x-ray source, excitation optics, and collection optics greatly expands the usability and ability.

[0027]As mentioned above, it is also useful to monochromatize the x-ray beam i...

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Abstract

An x-ray system or method for exciting a sample under x-ray analysis, using a curved monochromating optic for directing a monochromatic x-ray beam from an x-ray source towards a first focal area. A second optic is positioned within, and receives, the monochromatic x-ray beam, and directs a focused x-ray beam towards a second focal area on the sample. A detector is positioned near the sample to collect radiation from the sample as a result of the focused x-ray beam. The curved monochromating optic produces a beam spot size at the first focal area larger than a beam spot size produced by the second optic at the second focal area, therefore, a beam spot size on the sample is thereby reduced using the second optic. Doubly-curved monochromating optics, and polycapillary optics, are disclosed as possible implementations of the optics.

Description

[0001] Cross References to Related Applications [0002] This application claims the benefit of US Provisional Application Serial No. 60,705,376, filed August 4, 2005, which is hereby incorporated by reference. This application also contains subject matter related to that of the following applications, which are hereby incorporated by reference in their entirety: [0003] U.S. Application Serial No. 11 / 048,146, "AN OPTICAL DEVICE FOR DIRECTING X-RAYS HAVING APLURALITY OF OPTICAL CRYSTALS," filed February 1, 2005, filed July 25, 2003 and filed at Continuation of PCT Application PCT / US2003 / 023412 published in English under the PCT Treaty as WO 2004 / 013867 A2 on February 12, 2004, which claims the benefit of U.S. Provisional Application 60 filed on August 2, 2002 / Priority No. 400,809. technical field [0004] The present invention relates generally to x-ray optics. More particularly, the present invention relates to an arrangement of x-ray optics and associated systems for p...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G21K1/06G01N23/223
CPCB82Y10/00G21K2201/064G01N23/223G21K2201/061G21K1/06G21K2201/062G01N2223/076
Inventor 陈泽武高宁W·吉布森
Owner X-RAY OPTICAL SYSTEM INC
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