Multi-test seat test station having in-turn arranged feeding section, test section and discharging section

Abstract

The invention discloses a detection method comprising the steps as follows: a charging zone, a testing zone and a discharging zone are arranged along a first direction; a bearing mobile device and a pick-up device are mutually opposite and configured along a second direction, and oppositely move in the three zone along the first direction; the components to be tested of the charging zone is sucked by the bearing mobile device through the staggered trend design of the bearing mobile device and the pick-up device; the components to be tested are moved to testing seats of a testing zone; and after each testing seat is driven to pass through units such as a flat testing unit, an electrical testing unit, an efficiency testing unit, etc. by a driving device, the tested component is moved to the discharging bearing disk of the discharging zone by the pick-up device to be positioned. Therefore, the massive detection of the batch is performed, the charging and the discharging is respectively arranged at both ends of the testing zone, so that the machine configuration is integrated, the carrying efficiency and the testing efficiency are improved, the moving frequency of objects to be tested is further reduced, and the yield rate is prevented from reduction due to pointless deterioration.

Description

【Technical field】 [0001] The invention relates to a testing machine, in particular to a multi-test seat testing machine with sequentially arranged feeding areas, testing areas and discharging areas. 【Background technique】 [0002] Regardless of semiconductor components or optical sensing components, before they leave the factory or go online, they must go through layers of inspections to confirm the quality of the components. [0003] As shown in Figure 1, Taiwan's new patent No. 551500, titled "Conveying device for IC testing machine", discloses an automatic testing machine 1, and its machine 1 is provided with a plurality of testing devices 10, each testing device 10 A single test pedestal 100 is formed on each of them. When the carrier tray 121 carrying the IC to be tested is placed in the feeding area 12, the left cantilever pick-and-place device 13 will move to the top of the carrier tray 121, and the suction nozzle 130 will be driven to pick up the IC to be tested. co...

AI Technical Summary

Problems solved by technology

[0012] Compared with the previous case, the material transfer device 34 of the previous case corresponds to the left cantilever pick-and-place device 13 of the earlier case, and is also responsible for moving the component to be tested from the feeding area to a transfer device, and from the transfer device After taking out the tested components to the discharge area, it is still necessary to use a single robot arm and suction nozzle to undertake all the feeding/discharging actions, and perform X-Y-Z three-direction movements, without any speed-up effect

[0013] As for the test part of the second half, although the previous proposal changed to use two sets of carrying mobile devices 33, 35 to distinguish the left and right, and six sets of pick-and-place mechanisms 331, 351 to drive the suction nozzles 332, 352, which can speed up the overall process at first glance; Above, the movement lines of each group of pick-and-place mechanisms and suction nozzles must be moved in the Y direction up and down in the figure and the Z direction of the lifting nozzle at the same time, and the complexity of the action itself has not been reduced.

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