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Frequency tripling using spacer mask having interposed regions

一种间隔物、掩模的技术,应用在制造半导体器件领域,能够解决尺寸缩减没有后果等问题

Inactive Publication Date: 2008-12-03
APPLIED MATERIALS INC
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0003] However, the size reduction is not without consequences

Method used

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  • Frequency tripling using spacer mask having interposed regions
  • Frequency tripling using spacer mask having interposed regions
  • Frequency tripling using spacer mask having interposed regions

Examples

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Embodiment Construction

[0017] A method for tripling the frequency of a semiconductor photolithography process will be described below. In the following description, numerous specific details are set forth, such as manufacturing conditions and material formulations, in order to provide a thorough understanding of the present invention. It will be apparent, however, to one skilled in the art that the present invention may be practiced without these specific details. In other instances, well-known features, such as integrated circuit design layouts or photoresist development processes, have not been described in detail in order not to unnecessarily obscure the present invention. Furthermore, it should be understood that the various embodiments shown in the drawings are exemplary representations and are not necessarily drawn to scale.

[0018] In one embodiment, a method for fabricating a semiconductor mask is provided. A semiconductor stack may first be provided with a sacrificial mask consisting of ...

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Abstract

The present invention relates to frequency tripling using spacer mask having interposed regions. A method for fabricating a semiconductor mask is described. A semiconductor stack having a sacrificial mask comprised of a series of lines is first provided. A spacer mask having spacer lines adjacent to the sidewalls of the series of lines of the sacrificial mask is then formed. The spacer mask also has interposed lines between the spacer lines. Finally, the sacrificial mask is removed to provide only the spacer mask. The spacer mask having interposed lines triples the frequency of the series of lines of the sacrificial mask.

Description

technical field [0001] Embodiments of the invention relate to the field of semiconductor processing. More particularly, embodiments of the present invention relate to methods of fabricating semiconductor devices. Background technique [0002] Over the past few decades, the reduction in size of features in integrated circuits has been a driving force for the growing semiconductor industry. Scaling features to smaller and smaller dimensions can increase the density of functional units on the limited available area of ​​a semiconductor chip. For example, shrinking transistor size allows for an increase in the number of logic and memory devices included on a microprocessor, allowing the manufacture of products of greater complexity. [0003] However, the size reduction is not without consequences. As the dimensions of the fundamental building blocks of microelectronic circuits are reduced and as the sheer number of fundamental building blocks fabricated in a given area increa...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G03F1/00H01L21/00H01L21/027G03F1/30
CPCH01L21/0273H01L21/0337Y10S438/947H01L21/0332H01L21/0274Y10S438/95
Inventor 克里斯多佛·D·本彻尔堀冈启治
Owner APPLIED MATERIALS INC