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Method for over-temperature protection through monitoring power tube junction temperature by collecting anode penetration current

A technology of over-temperature protection and current monitoring, applied in the direction of amplifier protection circuit layout, etc., can solve the problem of destroying the normal operation of the circuit, and achieve the effect of improving reliability

Active Publication Date: 2010-09-29
WUXI YOUDA ELECTRONICS
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

On the one hand, this thermal oscillation will destroy the normal operation of the circuit. On the other hand, due to the different temperature coefficients of the parts of the silicon chip and the package shell, it will also generate additional stress at the connection between the silicon chip and the package shell.

Method used

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  • Method for over-temperature protection through monitoring power tube junction temperature by collecting anode penetration current
  • Method for over-temperature protection through monitoring power tube junction temperature by collecting anode penetration current
  • Method for over-temperature protection through monitoring power tube junction temperature by collecting anode penetration current

Examples

Experimental program
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Effect test

Embodiment Construction

[0027] For thermal sampling, the leakage current of the ICEO increases with the temperature as the power of 2. When the temperature rises by 100 degrees, the current can increase by 1000 times. At this time, the leakage current cannot be ignored and can reach uA level current.

[0028] During normal operation, the charging tube Q222 charges the oscillating capacitor C7 to the power supply. Usually, the upper plate of the oscillating capacitor C7 is positively charged, and the lower plate is negatively charged. The plate is at the same potential as the upper plate, and the discharge tube Q207 always has current. When charging the oscillating capacitor C7, the discharge current ic3 is negligible. When discharging, the discharge tube Q207 is discharged, and the current of the discharge tube Q207 is very small. The entire cycle is mainly determined by the discharge time.

[0029] During the discharge process of the capacitor to the discharge tube Q207, the first level comparator Q...

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Abstract

The invention relates to a method for monitoring large power valve junction temperature for over-temperature protection whose principle is that collector ICEO of triode increases in exponent of 2 following temperature. Ordinarily, upper polar plate of oscillator capacitance has positive charge, lower polar plate has negative charge. Charging tube charges positive charge to the lower polar plate of the oscillator capacitance untill lower polar plate is the same potential with upper polar plate when charging tube has current all along, and discharging current ic3 is neglected when charging tubecharges oscillator capacitance; when discharging tube is discharged, current of discharging tube is small, whole period is decided by discharging time; ICEO increases in exponent of 2 following temperature which can guarantee the in time monitoring for output tube junction temperature, that is, ICEO is in closed state in large time and effectively promote reliability of circuit.

Description

technical field [0001] The invention relates to over-temperature protection by monitoring the junction temperature of a high-power tube by collector penetration current, and belongs to the technical field of integrated circuit design. Background technique [0002] One of the important reasons for the failure of high-power power amplifiers is that the junction temperature of the output tube exceeds the allowable value due to the large current. In an integrated power amplifier, the junction temperature of the output tube determines the temperature of the chip. For this reason, the junction temperature rise of diodes or transistors is often used as temperature-measuring elements, and they are placed close to the output tube to reflect the temperature rise of the output tube. When the temperature rise of the output tube exceeds the allowable value, the temperature-measuring diode (or transistor) starts A circuit, the output tube drive current is reduced to reduce the chip tempe...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H03F1/52
Inventor 朱伟民卜惠琴聂卫东
Owner WUXI YOUDA ELECTRONICS
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