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High sensitivity nondestructive detection method of array type flexible vortex flow probe and probe apparatus thereof

An eddy current probe, high-sensitivity technology, used in measuring devices, electrical devices, instruments, etc., can solve the problems of low resolution of probes, reduced flexibility, insufficient individual inductance of coil units, etc., to achieve high sensitivity without loss. The effect of detection, improved sensitivity, and increased individual inductance

Inactive Publication Date: 2009-04-22
林俊明 +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The existing array type flexible eddy current probe is a coil array composed of many small coils densely distributed on the flexible circuit board according to a specific structure type. These small coils can be arranged in a line or a plane. When working, electronic methods are used According to the set logic program, the coil array units are switched in time, and the eddy current response signals obtained by each coil unit are connected to the signal processing system of the instrument to complete an array tour inspection and a detection process of an array eddy current detection probe. It is equivalent to the traditional single eddy current detection probe's detection process of repeated back-and-forth step-scanning on the component's inspected surface, so the array type eddy current detection probe has great advantages for large-area eddy current detection, and the flexible circuit board is used as a small coil The carrier makes the detection line or detection surface formed by each array coil unit flexible. In this way, the array type flexible eddy current probe can be bent into a shape corresponding to the measured position of the component, which greatly improves the probe resistance. Adaptability to detection of components with different shapes, however, because the coil is directly fabricated on the flexible circuit board, limited by the process conditions, the number of turns of the coil formed per unit area is too small, resulting in insufficient individual inductance of the coil unit, resulting in the probe The disadvantage of low resolution, although the number of coil turns per unit area can be increased by increasing the number of layers of the flexible circuit board, but the increase in the number of layers of the flexible circuit board will inevitably lead to an increase in the overall thickness of the probe. In this way, the flexibility of the probe is reduced, which cannot meet the detection requirements of components of various shapes. Therefore, the number of layers of the flexible circuit board should generally be controlled within a certain range. In this way, the number of coil turns per unit area of ​​the entire probe It is still too little, and the individual inductance of the coil unit is still insufficient, so that the resolution of the probe is still not high. Compared with the array type eddy current detection probe that does not use a flexible circuit board, its detection effect is still not ideal

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  • High sensitivity nondestructive detection method of array type flexible vortex flow probe and probe apparatus thereof
  • High sensitivity nondestructive detection method of array type flexible vortex flow probe and probe apparatus thereof
  • High sensitivity nondestructive detection method of array type flexible vortex flow probe and probe apparatus thereof

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Embodiment Construction

[0030] The high-sensitivity non-destructive testing method of the array type flexible eddy current probe of the present invention is to place a back pad made of ferrite and the like on the back of the conventional array type flexible eddy current probe relative to the detection side, and adopt the conventional The eddy current testing method performs eddy current testing on the components; the back pad completely covers all the small coils in the conventional array flexible eddy current probe, and increases the individual inductance of each coil unit during testing.

[0031] Referring to the accompanying drawings, the high-sensitivity array flexible eddy current probe device of the present invention includes:

[0032] A flexible circuit board 1, the flexible circuit board 1 is provided with a plurality of spiral printed coils 2 arranged in a certain array; each printed coil is provided with a printed lead 20 to connect with an external processing circuit;

[0033] A back pad 3 m...

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Abstract

The invention discloses a high-sensitivity nondestructive detection method used for detecting an array-typed flexible eddy probe, and a probe device thereof. A back pad that the normal array-typed flexible eddy probe is corresponding to the detection surface is made of material such as ferrite; furthermore, the eddy detection on the component is carried out by a normal eddy detection method; the back pad completely covers all small coils in the normal array-typed flexible eddy probe; when in detection, individual inductance of each coil unit is increased. By improving the individual inductance of each coil unit, the sensitiveness of the probe is improved, thus leading the array-typed flexible eddy probe to realize the nondestructive detection on the detected component with high sensitiveness.

Description

technical field [0001] The invention relates to a nondestructive testing method and a probe device thereof, in particular to an array type flexible eddy current probe high-sensitivity nondestructive testing method and a probe device thereof. Background technique [0002] Non-destructive testing NDT (nondestructive test) is a detection method that does not damage or affect its future performance or use on materials or workpieces. By using NDT, defects existing in the interior and surface of materials or workpieces can be found, and workpieces can be measured. It can determine the internal composition, structure, physical properties and state of materials or workpieces. Non-destructive testing technology has been widely used in various industrial fields, such as manufacturing, aerospace, petrochemical and other fields. There are many methods of non-destructive testing, such as eddy current testing methods, ray testing methods, magnetic memory testing methods, magnetic flux le...

Claims

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Application Information

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IPC IPC(8): G01N27/90G01B7/00G01N27/904
Inventor 林俊明王琪
Owner 林俊明
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