Unlock instant, AI-driven research and patent intelligence for your innovation.

White light shearing interferometer aplanatic rapid adjustment method

A cutting interferometer and fast adjustment technology, applied in the direction of instruments, optics, scientific instruments, etc., can solve the problems of uncontrollable precision, non-compliance and other optical path adjustment, and achieve the effect of fast precision

Inactive Publication Date: 2009-05-06
SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI
View PDF2 Cites 3 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

This method can adjust the equal optical path of a general white light interferometer, but it is not suitable for the adjustment of the equal optical path of a white light shearing interferometer, and the accuracy of this method is uncontrollable during adjustment, which does not conform to the above-mentioned Mach-Zehnder shearing interference Requirements for equi-optical length adjustment of the instrument

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • White light shearing interferometer aplanatic rapid adjustment method
  • White light shearing interferometer aplanatic rapid adjustment method
  • White light shearing interferometer aplanatic rapid adjustment method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0032] The present invention will be further described below in conjunction with the accompanying drawings and embodiments, but the protection scope of the present invention should not be limited thereby.

[0033] see first figure 1 , figure 1 Shown is a schematic diagram of the adjustment method of the present invention for a general shearing interferometer, wherein 1 is an adjustable chirped laser, 2 is a beam expander collimating lens, 12 is an interferometer to be adjusted, and 9 is an observation screen. S in the figure represents the shear amount (including transverse and radial shear amount) generated after the beam passes through the interferometer. The rapid adjustment method of the optical path of the white light shearing interferometer includes the following steps:

[0034] ① An adjustable chirped laser 1 and a beam expander collimator lens 2 are arranged in front of the laser input window of the white light shearing interferometer 12 to be adjusted, and the laser...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A rapid light path adjustment method of a white light cutting interferometer, and the like mainly utilizes an adjustable chatter laser as a light source to change the motion speed of interference fringes generated by the interferometer and observe the motion situations of the interference fringes of an observation screen of the white light cutting interferometer through adjusting the wavelength width of a laser pulse and adjusting a movable light path of the white light cutting interferometer, thereby the rapid adjustment of the light paths of the interferometer is realized. The method has the advantages of simplicity, convenience, rapidness and gradually controllable accuracy.

Description

technical field [0001] The invention relates to a white light shearing interferometer, in particular to a method for quickly adjusting the optical path of the white light shearing interferometer. Background technique [0002] The shearing interferometer obtains the information of the wavefront through the interference of the wavefront to be measured and its own copy surface, and has been widely used in various fields such as optical inspection, optical measurement, holography, optical information processing, laser speckle and infrared technology. Among them, the white light shearing interferometer is not limited by the coherence of the light source to be measured due to the use of equal optical path interference, and is suitable for white light sources and various wide-spectrum laser sources, including semiconductor laser sources and some chemical laser sources. The accuracy of the equal optical path adjustment determines the performance of the white light shearing interfero...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G02B27/00G01J9/02
Inventor 严毅刘立人栾竹王利娟金晓峰
Owner SHANGHAI INST OF OPTICS & FINE MECHANICS CHINESE ACAD OF SCI