Unlock instant, AI-driven research and patent intelligence for your innovation.

Embedded module test and maintenance bus system

A technology of module testing and bus system, applied in the direction of measuring electricity, measuring devices, measuring electrical variables, etc., can solve the problems that cannot meet the needs of the development of aviation electronics, and achieve the effects of low power consumption, fast positioning, and convenient use

Inactive Publication Date: 2012-07-04
CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST
View PDF0 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0007] Most of the existing avionics system module board tests are specially made for a certain board, which is far from meeting the needs of avionics development.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Embedded module test and maintenance bus system
  • Embedded module test and maintenance bus system
  • Embedded module test and maintenance bus system

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0022] Such as figure 1 , figure 2 Shown, a kind of embedded module test and maintain bus system, comprise: bus monitor, a plurality of embedded module test connected by TM bus and maintain bus interface unit (bus interface unit, be called for short BIU), described embedded The module test and maintenance bus interface unit is connected with the bus monitor.

[0023] Wherein, the TM bus is a serial backplane bus with a multi-site topology, consisting of four required signal lines and an optional signal line in the following table:

[0024] signal name

I / O

illustrate

MCLK

input

TM bus clock

MCTL

input Output

TM bus control

MMD

input Output

TM bus master module data

MSD

input Output

TM bus slave module data

MPR

input Output

TM bus suspend (optional)

[0025] Wherein, the BIU adopts a master-slave communication protocol. At any time, only one BIU obtains the master control ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to an embedded module test and maintenance bus system, which comprises a bus monitor and a plurality of embedded module test and maintenance bus interface units connected with a TM bus; wherein the embedded module test and maintenance bus interface units are connected with the bus monitor; a principal and subordinate communication protocol is used between the embedded moduletest and maintenance bus interface units. A plurality of embedded module test and maintenance bus interface units comprise a principal module and a subordinate module; the logical processing parts ofthe principal module and the subordinate module are arranged in the same chip; the subordinate module is distinguished with an input module identifier. The invention provides a new on-line system detecting means, wherein built-in self-testing and functional circuits are divided, thus state monitoring and fault analysis can be realized well, fault modules and fault types can be positioned rapidly and separated.

Description

technical field [0001] The invention belongs to the field of system integrated circuit design and test engineering, in particular to embedded module test and maintenance bus technology. Background technique [0002] With the advancement of technology and the increasing complexity of the system, reliability, maintainability and comprehensive support work has become an important part of the development project. [0003] Module test and maintenance bus (module test and maintenance bus), that is, TM bus, is produced with the rapid development of integrated circuits. Since ultra-high-speed integrated circuit technology has greatly improved the integration of chips, in order to ensure that these chips can stably and reliably realize the functions required by the design, they must be regularly tested during production and use. In this way, people hope to take the testability design into consideration when making components to support the detection and maintenance functions at the ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): G01R31/3185
Inventor 周梅章宇东李修杰
Owner CHINESE AERONAUTICAL RADIO ELECTRONICS RES INST