LCD substrates test device and method thereof
A liquid crystal display and testing device technology, applied to measuring devices, instruments, measuring electronics, etc., can solve the problems of high equipment cost, low production efficiency, high missed detection rate, etc., and achieve the effect of accurate detection
Inactive Publication Date: 2010-09-22
CHANGSHA YUSHUN TOUCH TECH
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Problems solved by technology
[0008] The purpose of the present invention is to overcome the defects of low production efficiency, high missed detection rate, or high equipment cost in the existing detection device, provide a detection device with high efficiency and reliability, and low cost, and use the device to perform method of testing
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[0025] The specific embodiment of the present invention will now be described in detail in conjunction with the accompanying drawings.
[0026] A liquid crystal display substrate testing device includes a power supply 40, an alarm 20, a switch 30, and a set of probes made of conductive materials. Wherein, a group of probes includes a first probe 11 and a second probe 12 . Such as figure 1 As shown, the power supply 40, the alarm 20 and the switch 30 are connected in series between the first probe 11 and the second probe 12, such as the alarm can be connected in series between the first probe 11 and the second probe 12 20. The power supply 40 and the switch 30, and ensure that the first probe 11 and the second probe 12 are not conducted with each other. The applied alarm 20 may be an audible or visual alarm system, or an audible and visual alarm system, so that the detection result can be effectively prompted. The applied probes are preferably made of low-hardness conductive...
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The invention discloses a liquid crystal display substrate testing device, and in particular relates to a testing device for detecting a conductive pattern made on a glass substrate in the manufacturing process of a liquid crystal display, which comprises a power supply, an alarm, a switch, a first probe and a second probe made from a conducting material, wherein the power supply, the alarm and the switch are connected between the first probe and the second probe in series; and a probe clearance adjusting unit is arranged between the first probe and the second probe. When a test is performed,the probe clearance adjusting unit adjusts the distance between the first probe and the second probe to be consistent with the distance between electrodes on a liquid crystal display substrate to be tested; then the switch is turned on to be in a conducting state, and the liquid crystal display substrate testing device is moved along the normal line direction of the electrodes; and when the alarmgives out alarm, a short circuit defect exists between the adjacent electrodes. The liquid crystal display substrate testing device has the characteristics of higher efficiency and reliability and low cost, and is convenient to use.
Description
technical field [0001] The invention relates to a test device and a test method for testing a high-density conductive pattern, in particular to a test device and a test method for testing a conductive pattern after it is made on a glass substrate in a liquid crystal display manufacturing process. Background technique [0002] At present, liquid crystal display (LCD) panels on the market can be generally classified into twisted nematic (TN-Twisted Nematic), super twisted nematic (STN-Super TN) and thin film transistor (TFT-Thin) according to their working principles. Film Transistor). Among them, the twisted nematic type and the super twisted nematic type are called passive display panels, and the thin film transistor type is called active display panels. [0003] The general manufacturing method of passive liquid crystal display devices is as follows: firstly, a specific conductive pattern is made on two conductive glass substrates; then, an alignment layer is made on the c...
Claims
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IPC IPC(8): G02F1/13G01R31/00
Inventor 宋宇红杨顺林邓建平周宗文
Owner CHANGSHA YUSHUN TOUCH TECH