Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Visualization automatic generation method of embedded software test data and system thereof

An embedded software and test data technology, applied in software testing/debugging, program control devices, etc., can solve problems such as inability to meet real-time, concurrent description mechanism, low test efficiency, and poor applicability of test data

Inactive Publication Date: 2009-11-04
BEIHANG UNIV
View PDF0 Cites 55 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] At present, the main means of generating test data for many embedded software at home and abroad is manual, and some methods of automatically generating test data often cannot meet the requirements of test adequacy, or cannot meet the description mechanism of real-time and concurrent aspects of embedded software test data. , leading to poor applicability of test data and low test efficiency

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Visualization automatic generation method of embedded software test data and system thereof
  • Visualization automatic generation method of embedded software test data and system thereof
  • Visualization automatic generation method of embedded software test data and system thereof

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0071] In order to facilitate those of ordinary skill in the art to understand and implement the present invention, the present invention will be described in further detail below in conjunction with the accompanying drawings. It should be understood that the implementation described here is only for illustration and explanation of the present invention, and is not intended to limit the present invention .

[0072] Real-time extension based on the de facto industry standard - Unified Modeling Language UML, from three aspects of stereotype (Stereotype), tagged value (Tagged Value) and constraint (Constraint), and combined with various diagrams of UML (Diagram) (as class diagram, sequence diagram and state diagram) embedded software testing process is modeled, to improve applicability and effectiveness of the present invention, main method is as follows:

[0073] Static modeling aspects. In order to apply the UML class diagram to the field of embedded software testing, the inve...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a visualization automatic generation method of embedded software test data and a system thereof. The method comprises the following steps: adopting a de facto industrial standard--universality and flexibility of a unified modeling language (UML), performing real-time expansion on the UML, and introducing a scene technology to realize automatic generation of the embedded software test data in a visualization manner. The developed automatic test data generation system can automatically transform the test data into a test script required for a specific test platform, and running of the test script can drive the test for running to realize automatic testing for the embedded software.

Description

technical field [0001] The method belongs to the field of automatic testing of embedded software and the field of test data generation. Background technique [0002] As a great invention of the last century, computers are profoundly affecting and changing human life. Embedded system is undoubtedly a very active branch in the computer application field, and it is playing an increasingly important role in various fields such as military affairs, industry, medical treatment, education and finance. With the increasing scale and complexity of these embedded systems, more and more problems are exposed, and the quality and reliability of software have become one of the key factors restricting system security. In the development or use of embedded systems, a large number of failures are caused by software factors. For example, 60% of the accidents caused by spacecraft launches and aircraft test flights are caused by software, and have caused very serious consequences, affecting the...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G06F9/44G06F11/36
Inventor 殷永峰刘斌杨顺昆陈皓晖
Owner BEIHANG UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com