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Static random-access memory with boosted voltages

A static random and memory technology, applied in the field of integrated circuits, can solve the problem of consuming substrate area and so on

Active Publication Date: 2009-12-09
INTEL CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

At the same time, the use of oversized transistors in memory elements can consume a large amount of real estate on an integrated circuit, which is undesirable

Method used

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  • Static random-access memory with boosted voltages
  • Static random-access memory with boosted voltages
  • Static random-access memory with boosted voltages

Examples

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Embodiment Construction

[0033] The present invention relates to static random access memory circuits. The memory circuits of the present invention may be used in any suitable integrated circuit. For example, the memory circuit may be used in an integrated circuit memory device or an application specific integrated circuit (ASIC). The memory circuit can also be used in a class of programmable logic device integrated circuits or programmable integrated circuits that are not traditionally called programmable logic devices, such as digital signal processors containing programmable logic or custom integrated circuit. The present invention will sometimes be described in the context of integrated circuits, such as, for example, programmable logic device integrated circuits.

[0034] figure 1An exemplary integrated circuit, such as programmable logic device 10, in accordance with the present invention is shown.

[0035] Programmable logic device 10 has input / output circuitry 12 for driving signals out of...

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Abstract

Dual port memory elements and memory array circuitry that utilizes elevated and non-elevated power supply voltages for performing reliable reading and writing operations are provided. The memory array circuitry may contain circuitry to switch a power supply line of a column of memory elements in the array to an appropriate power supply voltage during reading and writing operations. Each memory element may contain circuitry to select between power supply voltages during reading and writing operations. During reading operations, an elevated voltage may power cross-coupled inverters that store data in the memory elements while a non-elevated voltage may be used to turn on associated address transistors. During writing operations, the non-elevated voltage may power the cross-coupled inverters while the elevated voltage may be used to turn on the associated address transistors.

Description

technical field [0001] The present invention relates to integrated circuits with random access memory elements, and more particularly, to integrated circuits with static random access memory elements using boosted voltages. Background technique [0002] Integrated circuits often contain memory elements. Static random access memory elements may be based on cross-coupled inverters and may be used to store data. Each memory element can store a single bit of data. The memory elements are typically arranged in an array. Dual-port memory elements allow read and write operations to be performed on two separate ports. [0003] Dual port memory arrays are used in integrated circuits such as integrated circuit memories and programmable logic devices. [0004] A programmable logic device is a class of integrated circuits that can be programmed by the user to implement desired custom logic functions. Typically, logic designers use computer-aided design (CAD) tools to design custom ...

Claims

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Application Information

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IPC IPC(8): G11C11/41G11C11/413
CPCG11C11/413G11C11/412G11C8/16
Inventor S·佩里塞蒂
Owner INTEL CORP
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