Contour line quality detection method

A quality inspection method and contour line technology, applied in the field of measurement, can solve problems such as the inability to determine the actual deviation, the large difference in quality of qualified products, and rough interval comparison, etc., to improve the detection speed and efficiency, high accuracy, and reduce The effect of human error

Inactive Publication Date: 2009-12-30
HEXAGON METROLOGY SPA
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Problems solved by technology

[0003] For the quality inspection of product contour lines, especially for non-standard contour lines, the current detection mainly adopts a relatively rough interval comparison, that is, as long as the product contour line falls within the range of the specified contour line floating, the actual deviation There is no way to determine how much, the detection quality is low, resulting in a large quality difference between qualified products, so it is necessary to improve

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Embodiment Construction

[0017] The method for detecting the quality of contour lines provided by the invention, the method is carried out in conjunction with a photoelectric measuring instrument, and comprises the following steps:

[0018] 1) Input the standard graphics into the computer, and read the corresponding points or lines of the standard graphics in the world coordinate system of the computer as a reference, then construct a virtual grid in the computer, and record the outline of the virtual grid and the standard graphics the coordinates of the intersection point;

[0019] 2) Put the product under test into the measuring platform of the measuring instrument, and the measuring instrument will input the image of the product under test into the above-mentioned computer;

[0020] 3), according to the reference point or line obtained in step 1), locate the image of the product under test, make the image fall into the virtual grid, and then read the coordinates of the intersection of the virtual g...

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Abstract

The invention relates to the measurement technical field, in particular to a detection method for measuring product contour line combining a photoelectric instrument. The method includes the following steps: inputting a standard graph into a computer, reading corresponding point or line of the standard graph in the world coordinate system of the computer as the basis standard, and then constructing a virtual network in the computer and recording the coordinate of the intersecting point of the contour line of the standard graph and the virtual network; inputting the image of a product to be detected into the computer by a measurement instrument, leading the image to fall into a virtual grid and reading the coordinate of the intersecting point of the contour line of the image and the virtual grid; and comparing the coordinate value of the intersecting point of the contour line of the standard graph and the virtual grid with that of the intersecting point of the corresponding part of the contour line of the image and the virtual grid and judging the product contour line quality by coordinate deviation value. The invention has high detection precision and easy operation and accords with industrial utilization.

Description

Technical field: [0001] The invention relates to the field of measurement technology, in particular to a detection method for measuring product contour lines combined with photoelectric instruments. Background technique: [0002] With the development of science and technology, higher and higher requirements are put forward for precise positioning measurement, so it is difficult for traditional vernier calipers or screw measuring instruments to meet the measurement requirements. Then photoelectric measurement appeared, using an image grabber (such as CCD) to convert the image of the measured object into an electronic signal, and then the electronic signal is sent to the computer, and the image processing chip of the computer will enlarge the image and display it on the monitor, and then use the computer's three-dimensional coordinate Corresponding to capture measurement, this method can reduce measurement error and improve measurement accuracy. [0003] For the quality inspe...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01B11/24
Inventor 徐春云
Owner HEXAGON METROLOGY SPA
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