Display, and method of manufacturing display
A technology for a display device and a manufacturing method, applied to identification devices, nonlinear optics, instruments, etc., capable of solving problems such as reduced display performance, unreliable cutting, and increased wiring resistance
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Embodiment approach 1
[0080] Below, refer to Figure 1~Figure 10 The first embodiment of the present invention will be described. Here, as an embodiment of the display device, a liquid crystal display device will be described.
[0081] figure 1 It is a plan view schematically showing the structure of the drive circuit and wiring for the liquid crystal display device of this embodiment, Figure 7 Is a schematic plan view showing the structure of a pixel of the liquid crystal display device, Figure 8 It is a diagram schematically showing the cross-sectional structure of the liquid crystal display device.
[0082] In the liquid crystal display device 1 of this embodiment, the liquid crystal layer 4 is sandwiched between a pair of substrates 2 and 3, and the liquid crystal layer 4 is filled in the inner region of the sealing material 7 formed in a rectangular shape.
[0083] The substrate 2 is an element substrate and includes TFT16 as a switching element (refer to Figure 7 ), the pixel electrodes 17 connec...
Embodiment approach 2
[0114] Reference Picture 11 with Picture 12 The second embodiment of the present invention will be described. The difference from the first embodiment described above is that it is provided with a notch portion formed at a position spaced apart from the slit portion by a predetermined interval, and the rest is the same as the above embodiment. The same parts as those in the above-mentioned embodiment are denoted by the same symbols, and repeated descriptions are omitted.
[0115] among them, Picture 11 Is a partially enlarged plan view of the liquid crystal display device of this embodiment, Picture 12 It is an explanatory diagram showing the effect of the liquid crystal display device of this embodiment.
[0116] Such as Picture 11 As shown, there is provided a defect for correcting the defect when a short circuit occurs at the intersection (overlapping portion) 40 of the storage capacitor line (first conductive layer) 20 and the routing wiring (second conductive layer) 51 C...
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Abstract
Description
Claims
Application Information
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