Universal test system and method of integrated circuit

Abstract

The invention discloses a universal test system of an integrated circuit, which comprises a main control module, a test functional module and a test resource bus that are connected in sequence, wherein the test functional module provides a test resource for a tested integrated circuit through the test resource bus, the main control module comprises an MCU and an FPGA or a PC and an FPGA, the MCU or PC is used for controlling a test flow, the FPGA is used for processing operation and test result data of the test functional module, and the MCU and the FPGA or the PC and the FPGA are connected through a communication protocol bus. The invention enables the MCU to be free of complex test data processing and specific function control of the test functional module and to need only single processing control flow and can effectively lower the performance requirement on the MCU; the FPGA can provide user custom-made test functions for secondary development according to test requirements of different integrated circuits so as to achieve the purposes of better flexible universality and high-efficiency development and effectively improve the test efficiency.

Description

technical field [0001] The invention relates to the field of integrated circuit testing, in particular to a general testing system and method for integrated circuits. Background technique [0002] The general test solution is used for testing of various types of integrated circuits. [0003] In integrated circuit testing, the existing common testing methods for integrated circuits generally use PC (host computer) or MCU (microcontroller) as the main control module, and control specific test function modules through PC to provide bus test resources. In this method, the data processing and specific function control of the entire system are all processed in the background on the PC side, and its general structure is as follows: figure 1 shown. [0004] In existing test methods, FPGAs (logic programmable circuits) are generally only used in test function modules. [0005] In the existing test methods, the test vectors need to be read back to the PC or MCU and stored in the ba...

AI Technical Summary

Problems solved by technology

The data processing speed of this method is slow and cannot achieve the effect of real-time processing, and the increase of user-customized test functions depends entirely on the increase of test function modules, and the completion period is very long and the cost is high.

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