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Processing method, processing system and maintenance equipment for defects of liquid crystal display panel

A liquid crystal display panel and processing system technology, applied in the direction of image data processing, electrical digital data processing, architecture with multiple processing units, etc., can solve problems such as defects, low maintenance efficiency, and low judgment accuracy

Inactive Publication Date: 2010-03-10
BOE TECH GRP CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
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AI Technical Summary

Problems solved by technology

[0005] The object of the present invention is to provide a method, system and maintenance equipment for liquid crystal display panel defects in order to overcome the shortcomings of low accuracy in determining the type of liquid crystal display panel defects and low maintenance efficiency in the prior art

Method used

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  • Processing method, processing system and maintenance equipment for defects of liquid crystal display panel
  • Processing method, processing system and maintenance equipment for defects of liquid crystal display panel
  • Processing method, processing system and maintenance equipment for defects of liquid crystal display panel

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Embodiment Construction

[0055] The TFT devices of the TFT-LCD repaired by the laser repair equipment in the embodiment of the present invention are usually multi-layered and multi-crossed, with high graphic complexity, and the characteristics of defects are also diverse and complex, but at the same time, the same type of liquid crystal The panel device structure is basically the same, and the TFT pattern has strong repeatability. The occurrence mechanism of each defect may require different maintenance solutions. The technical solution provided by the embodiment of the present invention can automatically judge the defect and select a maintenance solution according to the defect type for maintenance.

[0056] figure 1 It is a flow chart of Embodiment 1 of the method for processing liquid crystal display panel defects of the present invention, including the following steps:

[0057] Step 101, collecting defect images of defect areas on the liquid crystal display panel;

[0058] Step 102, analyzing th...

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Abstract

The invention provides a processing method, a processing system and maintenance equipment for defects of a liquid crystal display panel. The processing method for the defects of the liquid crystal display panel comprises the steps of: acquiring defect images in a defect area on the liquid crystal display panel; analyzing the defect images and judging defect types; and searching corresponding maintenance schemes according to the defect types. The processing system for the defects of the liquid crystal display panel comprises an image acquisition module, a defect judgment module and a maintenance selection module. The maintenance equipment for the defects of the liquid crystal display panel comprises the processing system, a laser system, an electromechanical system and at least one controlhost computer. The processing method, the processing system and the maintenance equipment for the defects of the liquid crystal display panel can improve the accuracy of judging the defect types and improve the maintenance efficiency by analyzing the defect images, judging the defect types and then maintaining the liquid crystal panel according to the corresponding maintenance schemes.

Description

technical field [0001] The invention relates to the manufacturing field of liquid crystal displays, in particular to a processing method, processing system and maintenance equipment for liquid crystal display panel defects. Background technique [0002] During the manufacturing process of Thin Film Transistor Liquid Crystal Display (hereinafter referred to as TFT-LCD), defects may occur in the product due to foreign objects in the clean room and problems in setting process parameters. At present, there are generally three methods for detecting defects. The first is Human Visual Inspection, the second is Machine Visual Inspection, and the third is Electrical Parameter Inspection. . At present, most manufacturers still use the first detection method. The disadvantage of this method is that it has a lot to do with the subjectivity of the inspectors. Long-term detection will cause eye fatigue and affect the accuracy of the detection results. [0003] After the inspection opera...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02F1/13G06T7/00G06T1/40
Inventor 吕志超
Owner BOE TECH GRP CO LTD
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