Flat Panel Display Test Set

Abstract

A flat-panel display testing device, comprising a workbench, on which a turntable is arranged, and the turntable rotates along a vertical axis; a first machine platform is arranged on the above-mentioned turntable, wherein the first machine platform has: a bottom plate, on which The first baffle plate and the second baffle plate; the side plate, which is arranged vertically to the base plate; the first mechanical arm, which is arranged on the side plate, and has a third baffle plate; the second mechanical arm, which is arranged on the side plate relative to the first mechanical arm , with a fourth baffle plate, wherein the third baffle plate, the fourth baffle plate and the first baffle plate, the second baffle plate are in the same plane; the positioning device is movably arranged on the side plate and the first baffle plate, Between the planes where the second baffle, the third baffle and the fourth baffle are located, it is used to push the flat panel display against the first baffle, the second baffle, the third baffle and the fourth baffle. a baffle; and a first testing mechanism, which is set on the workbench and corresponds to the first machine, and is used to test the flat panel display on the first machine.

Description

technical field [0001] The invention relates to a test device for a flat panel display, in particular to a test device with a vertical test machine. Background technique [0002] As flat panel displays become more sophisticated, optical and electrical testing of flat panel displays becomes increasingly important. Existing test methods divide the optical test and electrical test into two different test devices. For example, when doing color temperature test and high voltage test, two sets of independent test instruments are required, which takes up a lot of space. Production line space and human and material resources. Moreover, when doing color temperature testing, it is required that the tested display placed on the testing machine be perpendicular to the electronic coupling device (charge coupled device, CCD) test lens (inclination angle <5°), especially for some special models. The requirements are very high, and the existing test bench cannot guarantee the verticali...

AI Technical Summary

Problems solved by technology

Existing test methods divide the optical test and electrical test into two different test devices. For example, when doing color temperature test and high voltage test, two sets of independent test instruments are required, which takes up a lot of space. Production line space and human and material resources

Moreover, when doing color temperature testing, it is required that the tested display placed on the testing machine be perpendicular to the electronic coupling device (charge coupled device, CCD) test lens (inclination angle <5°), especially for some special models. The requirements are very high, and the existing test bench cannot guarantee the verticality, which makes the color temperature adjustment and color temperature inspection test difficult to measure, and the data obtained by the adjustment test has a large deviation

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