Three-dimensional interference imaging spectrum method

A technology of interference imaging and spectroscopy, which is applied in the field of three-dimensional interference imaging spectroscopy, can solve the problems of large amount of calculation and difficult to guarantee the accuracy of alignment, and achieve the effects of improving measurement efficiency, applicable to a wide range of occasions, and avoiding stitching and alignment

Inactive Publication Date: 2010-09-01
BEIJING JIAOTONG UNIV
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Problems solved by technology

Since these methods need to take multiple shots and then fuse the data, they essentially need to align and match the same point data, which requires a large amount of calculation and the accuracy of the alignment is difficult to guarantee.

Method used

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  • Three-dimensional interference imaging spectrum method
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  • Three-dimensional interference imaging spectrum method

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Embodiment Construction

[0027] Measuring method of two-dimensional spatial information and one-dimensional spectral information

[0028] A spatially modulated interference imaging spectrometer is formed by using a double-slit interference device. like figure 1 Shown: Double Sewn S 1 , S 2 Perpendicular to the paper, a slit S is placed in front of the object, located in the slit S 1 , S 2 on the axis of symmetry. S 1 , S 2 can be regarded as two wavelet sources on the light wave emitted by S. as long as S 1 , S 2 The direction of the connecting line is parallel to the X axis, then the interferogram is always a straight line parallel to the Z axis (perpendicular to the inside of the paper). Assuming that the device is located in air, the expression of the optical path difference is:

[0029] Δ SP = l x d - - - ( 1 )

[0030] The two-dime...

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Abstract

The invention discloses a novel three-dimensional interference imaging spectrum method. In the method, by adopting a double-slit interference device, a slit is placed in front of an object as a main wave source, and a double-slit is taken as a sub-wave source; interference beam is collected by a cylindrical mirror; and a two-dimensional CCD detector for receiving the beam is placed on an image plane of the cylindrical mirror. The method organically combines an interference imaging spectrum technology with an optical three-dimensional measuring technology together, thus three-dimensional space information and spectrum information of the object can be measured simultaneously, and the information can be directly processed and combined into a three-dimensional color photo of the object.

Description

technical field [0001] The invention belongs to the technical field of three-dimensional interference imaging spectroscopy, in particular to a method for simultaneously acquiring three-dimensional spatial information and one-dimensional spectral information of an object. Background technique [0002] Imaging spectroscopy technology refers to the technology of obtaining a series of spectral images with two-dimensional spatial coordinates and using characteristic spectra to identify targets. Its essence is to obtain both the spatial images of the targets and their corresponding spectral curves. [0003] With the development of science and technology, more information is obtained: from obtaining two-dimensional spatial information to obtaining three-dimensional spatial information; extending from single visible light imaging to multi-spectral range; It is a trend to obtain spectral information again. [0004] So far, the various interferometric imaging spectroscopy techniques ...

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
Inventor 高瞻林泽鸣陈筱磊冯其波
Owner BEIJING JIAOTONG UNIV
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