Check patentability & draft patents in minutes with Patsnap Eureka AI!

Magnetic field sensor

A magnetic field sensor and substrate technology, applied in the direction of the magnitude/direction of the magnetic field, instruments, devices using electro-magnetic effects, etc., can solve the problems of low sensitivity, low linearity, incompatibility, etc., and achieve high sensitivity and high linearity Effect

Inactive Publication Date: 2010-09-08
NXP BV
View PDF4 Cites 4 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] As can be understood from the above, known magnetic field sensors, depending on the chosen solution, suffer from various disadvantages such as low sensitivity, low linearity, incompatibility with conventional baseline CMOS technology (usually triple-well technology) (due to the need for additional processing steps)

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Magnetic field sensor
  • Magnetic field sensor
  • Magnetic field sensor

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0044] It should be noted that the above-mentioned embodiments illustrate rather than limit the invention, and that those skilled in the art will be able to design many alternative embodiments without departing from the scope of the appended claims. In the claims, any reference signs placed between parentheses shall not be construed as limiting the claim. Use of the verb "to comprise" and its conjugations does not exclude the presence of elements or steps other than those in a claim. The article "a" or "an" preceding an element does not exclude the presence of a plurality of such elements. The invention can be implemented by means of hardware comprising several distinct elements, and by a suitably programmed computer. In the device claims enumerating several means, several of these means can be implemented by one and the same piece of hardware. Importantly, the mere fact that certain measures are recited in mutually different dependent claims does not indicate that these mea...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a magnetic field sensor comprising a substrate having a first side (S1). The substrate comprises at the first side (S1) a silicon comprising semiconductor layer (P-SUB) which comprises a buried N-well (DNW). A bipolar transistor having an emitter region (PE+, NE+), a base region (PB+, NB+), and a first collector region (CLR1) and a second collector region, is provided in the silicon comprising semiconductor layer (P-SUB). The emitter region (PE+, NE+) is located at the first side (S1) above the buried N-well (DNW). According to the invention the bipolar transistor is arranged such that, in operation, a part of an emitter current (IEM) that traverses the base region (PB+, NB+) is distributed over the first and second collector regions (CLR1, CLR2) obtaining a first and a second collector current (ICL1, ICL2), wherein a difference between the first and second collector currents (ICL1, ICL2) is determined by a magnetic field component (B x, B z ) perpendicular to a current plane. A bipolar magneto-transistor structure is obtained which is compatible with triple-well technology and that is sensitive to magnetic fields in a direction perpendicular to the current plane. The magnetic field sensor is compatible with triple-well technology and has a high linearity and a high sensitivity. The invention further relates to an integrated circuit comprising such magnetic field sensor (Snsr) and a card provided with such integrated circuit.

Description

technical field [0001] The invention relates to a magnetic field sensor, an integrated circuit comprising such a magnetic field sensor and a card comprising such an integrated circuit. Background technique [0002] There are many solutions for magnetic field detection in silicon integrated circuits, such as known Hall plates with integrated amplifiers, magnetotransistors (JFETs or MOSFETs) of bipolar or unipolar nature, magnetoresistors and magnetodiodes. [0003] US2005 / 0230770 discloses a vertical Hall element comprising: a substrate; a semiconductor region having a first conductivity type and disposed in the substrate; and a magnetic field detection portion disposed in the semiconductor region. The magnetic field detection portion can detect a magnetic field parallel to the surface of the substrate in a case where a current flows through the magnetic field detection portion in a vertical direction of the substrate. The semiconductor region is a diffusion layer comprising...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R33/06H01L43/06H10N52/00
CPCG01R33/0088H01L43/065G01R33/06G01R33/066
Inventor 维克托·泽尔恩罗伯图斯·A·M·沃尔特斯
Owner NXP BV
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More