Experimental system for simulating single event effect (SEE) of pulse laser based on optical fiber probe

Abstract

The invention discloses an experimental system for simulating a single event effect (SEE) of pulse laser based on an optical fiber probe, aiming to reduce beam spot diameter of the pulse laser and realize simulation of the SEE at a single device or a local circuit in a deep sub-micron integrated circuit. The system is composed of a pulse laser, an optical fiber probe and a probe platform, and the aperture of the conical tip of the optical fiber probe is 10nm-1mu m; the input end of the optical fiber probe is connected with the pulse laser, the optical fiber of the optical fiber probe close to the output end is fixed in a probe clip of the probe platform, the output end of the optical fiber probe is contacted with the detected position of an integrated circuit chip, and the optical fiber probe transmits the pulse laser to the output end from the input end; and the integrated circuit chip adopts two modes of being arranged or not arranged in a single event effect detection circuit board. By the invention, pulse laser with the beam spot diameter no more than 1 mu m can be output, thus realizing simulation of the SEE at a single device or a local circuit in a deep sub-micron integrated circuit and lowering the cost.

Description

technical field [0001] The invention relates to an experimental system for simulating single-particle effects with pulsed lasers, in particular to an experimental system for simulating single-particle effects with pulsed lasers based on fiber optic probes. Background technique [0002] The single event effect refers to the phenomenon that high-energy particles in space are incident on microelectronic devices or circuits in operation, causing logic errors, abnormal functions and even device damage. A large number of microelectronic devices and integrated circuits are used on the spacecraft. The safe and reliable operation of the spacecraft depends on the normal operation of these devices and circuits, and the orbiting spacecraft is always exposed to the impact of cosmic rays and high-energy particles in the earth's radiation belt. In radiation, once a single event effect occurs, it may cause fatal damage to the spacecraft. Therefore, it is of great significance to the develo...

AI Technical Summary

Problems solved by technology

[0009] The technical problem to be solved by the present invention is to solve the problem that the pulse laser beam spot diameter is too large in the traditional pulse laser simulation single event effect experimental system, use the fiber optic probe to output the pulse laser, reduce the beam spot diameter of the pulse laser, and realize deep Simulation of Single Event Effects of Individual Devices or Partial Circuits in Submicron Integrated Circuits

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