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Method for inspecting coating film defect in resin-coated film

An inspection method and coating technology, which can be used in optical testing for flaws/defects, devices for applying liquid to surfaces, coatings, etc., and can solve problems such as insufficient accuracy

Inactive Publication Date: 2010-10-20
SUMITOMO CHEM CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] However, the accuracy of this method is not necessarily sufficient, and in particular, a higher-precision inspection method that can detect fine defects in the coating film of a heat-resistant separator is expected.

Method used

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  • Method for inspecting coating film defect in resin-coated film
  • Method for inspecting coating film defect in resin-coated film
  • Method for inspecting coating film defect in resin-coated film

Examples

Experimental program
Comparison scheme
Effect test

Embodiment

[0030] Defect inspection was performed on a resin-coated film having a coating of about 1 mm in length x about 0.5 mm in width in which a coating film composed of modified aramid and alumina was formed on a porous polyethylene film. A light source was placed about 10 cm above the resin-coated film and irradiated. A CCD camera was placed at a position with a height of 80 cm and a reflection angle of 13°. The reflected light was captured and processed by an image processing device.

[0031] The equipment used is shown below.

[0032] light source:

[0033] 400nm LED (peak wavelength 400nm) (manufactured by IMAC Co., Ltd.)

[0034] 392nm fluorescent lamp (peak wavelength: 392nm) (manufactured by AITEC SYSTEM Co., Ltd.)

[0035] Ultraviolet light tube fluorescent lamp (peak wavelength: 350nm) (manufactured by National)

[0036] CCD Camera Line Sensor Camera (Rain Sensakamera) (manufactured by Nagase Sangyo Co., Ltd.)

[0037] Image processing device: (manufactured by Nagase Sa...

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Abstract

Disclosed is a method for inspecting a resin-coated film, wherein an inspection of coating film defects is performed on a resin-coated film which is composed of a film and a coating film formed thereon by applying a resin solution over the film. This method for inspecting a resin-coated film is characterized in that an inspection is performed by irradiating a coating film with inspection light having a peak wavelength of luminous intensity within the range of 385-415 nm and detecting the light reflected by the coating film. By this method, coating film defects in a resin-coated film can be inspected with high precision.

Description

technical field [0001] The present invention relates to a method for inspecting coating film defects of a resin-coated film composed of a film and a coating film formed by coating a resin solution thereon. Background technique [0002] A resin-coated film (hereinafter referred to as a heat-resistant separator) obtained by coating a solution containing a heat-resistant nitrogen-containing aromatic polymer and a ceramic powder to form a coating film is used as a non- Separators for aqueous electrolyte batteries are commonly used. If there are defects such as pinholes or peeling in the coating film of the heat-resistant separator, the heat resistance may be lowered, and the safety after use of the battery may be lowered. [0003] In addition, a resin-coated sheet obtained by coating a resin on a parting sheet is used in the production of prepregs, but defects such as resin drop-off in the coating film of the resin-coated sheet are harmful to the prepreg. The quality of the bi...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/88C08J7/04G01N21/84G01N21/892G01N21/894H01M2/16B05D3/00H01M50/414H01M50/417H01M50/451H01M50/489
CPCH01M2/1686G01N21/894G01N21/33H01M10/05H01M2/1653H01M10/0565Y02E60/10H01M50/417H01M50/489H01M50/451H01M50/414H01M50/411H01M50/449
Inventor 铃木孝志
Owner SUMITOMO CHEM CO LTD