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Method for locating and recognizing process multi-loop fluctuation source

An identification method and source location technology, applied in program control, instruments, special data processing applications, etc., can solve problems such as multi-loop performance degradation, and achieve the effect of solving performance degradation

Inactive Publication Date: 2010-11-17
EAST CHINA UNIV OF SCI & TECH
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Problems solved by technology

[0004] The beneficial effect of the present invention is that the accurate positioning of the fluctuation source is conducive to the maintenance and repair of the subsequent fault circuit, and is an important part of solving the problem of performance degradation of the multi-circuit at the device level

Method used

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  • Method for locating and recognizing process multi-loop fluctuation source
  • Method for locating and recognizing process multi-loop fluctuation source
  • Method for locating and recognizing process multi-loop fluctuation source

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Embodiment Construction

[0009] The specific steps of the process multi-loop fluctuation root identification analysis method based on Granger causality analysis are divided into three parts A to C:

[0010] (A) Data preprocessing

[0011] (1) Data screening: Spectral independent component analysis (spectral independent component analysis) is performed on the original data to obtain component-related ratio (CRR) and mixing matrix. Select the corresponding column in the mixing matrix of the pivot with the largest correlation element ratio value. Process variables corresponding to those larger coefficients whose sum of coefficients in this column exceeds 95% of the sum of coefficients in this column are screened out for subsequent analysis.

[0012] (2) Normalization processing: normalize the selected process variables.

[0013] (3) ADF unit root test is performed on each process variable to ensure that the analyzed data sequence is covariance stationary.

[0014] (B) Causal Analysis

[0015] (1) Gra...

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Abstract

The invention relates to a method for locating and recognizing a process multi-loop fluctuation source, in particular to a method for locating and recognizing a process multi-loop variable fluctuation source in the field of the system performance estimation and the fault detection and diagnosis of a process industry. The method screens out disturbed fluctuation variables containing similar frequency components by combining spectral independent component analysis, carries out the Granger causality examination and analysis of the disturbed fluctuation variables and intuitively expresses the cause-effect influence relation among the loop variables by using a cause-effect relation diagram so as to represent propagation paths disturbed by fluctuation, simplifies the cause-effect relation diagram by utilizing apriori process knowledge and filters secondary cause-effect relation branches in an automatic threshold value searching mode to obtain a main propagation path for locating and recognizing a fluctuation source. The invention has the advantages that the accurate locating of the fluctuation source is beneficial to the maintenance and overhaul of subsequent fault loops and is an important link for solving the problem of performance lowering of a device with multi-level loops.

Description

Technical field [0001] Process industry system performance evaluation and fault detection and diagnosis. Background technique [0002] When the process variable fluctuates in a large range in the multi-loop system of the process device, the performance indicators of most of the control loops will decline, and the real reason is often caused by the failure or interference of one of the control loops leading to performance degradation. Due to the interference propagation of fluctuations, most of its performance has "false" decline. If the problematic loop can be accurately located through analysis, and after proper maintenance and restoration of good performance, the fluctuation of the entire system may basically disappear, and the performance state of good operation can be restored. Therefore, effective localization and effective maintenance of problematic loops is an important part of solving the problem of device-level multi-loop performance degradation in the common case ...

Claims

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Application Information

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IPC IPC(8): G05B19/048G06F17/00
Inventor 夏春明吴钦郑建荣周凡棚
Owner EAST CHINA UNIV OF SCI & TECH
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