Serial interface communication testing system

A serial interface and communication testing technology, applied in transmission system, wireless communication, detecting faulty computer hardware, etc., can solve the problems of easily damaged COM port and inconvenient operation, and achieve the effect of real-time output and simple structure

Active Publication Date: 2010-11-17
泰州市智谷软件园有限公司
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

In this way, it is necessary to frequently switch the COM connection line between the sending end of the UART interface, the r

Method used

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Embodiment Construction

[0008] see figure 1 , a preferred embodiment of the present invention is a serial interface communication test system 100 , the serial interface communication test system 100 includes a control module 10 , a level conversion module 30 , a switch module 50 and a communication module 70 .

[0009] The control module 10 can be an existing PC, microcomputer and other devices with information processing and control functions, and the control module 10 can receive and send instructions or process information. The control module 10 has a first communication unit 12, a second communication unit 14 and a display unit 16, the first communication unit 12 and the second communication unit 14 can be existing serial communication ports, such as PC or The number of COM ports on the microcomputer is usually two. The first communication unit 12 has a serial interface transmitting (TX) pin 122 and a serial interface receiving (RX) pin 124, and the second communication unit 14 also has a serial...

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PUM

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Abstract

The invention provides a serial interface communication testing system comprising a control module, a level conversion module, a communication module, a first switch group and a second switch group. The level conversion module is electrically connected with the control module; the communication module is electrically connected with the control module; the first switch group is electrically connected with the control module, the communication module and the level conversion module; the second switch group is electrically connected with the level conversion module and the first switch group; the communication module comprises a first processing unit and a second processing unit; the first processing unit and the second processing unit transmit data with each other and are connected with thefirst switch group; the first switch group and the second switch group comprise a plurality of switches; the level conversion module is used for signal level conversion between the control module andthe communication module; the control module forms different testing loops by selectively switching on or switching off different switches in the first switch group and the second switch group; and the testing loops are respectively used for testing the communication status of the first processing unit and the second processing unit and the communication status of different communication loops between the first processing unit and the second processing unit.

Description

technical field [0001] The invention relates to a serial interface communication testing system, in particular to a serial interface communication testing system suitable for testing a processor of a wireless communication device. Background technique [0002] In order to make wireless communication devices such as mobile phones meet the use requirements in terms of communication quality, data transmission / reception speed and other indicators, the testing of such wireless communication devices is particularly important. Generally speaking, in many existing intelligent wireless communication devices, most wireless communication devices use embedded application processors to perform functions such as high-speed communication, such as Marvell's PXA310, PXA320 series and Samsung's S3C2410 , S3C2440 and other application processors. In order to ensure that the actions of transmitting information through the serial interface between the application processor and the peripherals o...

Claims

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Application Information

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IPC IPC(8): H04W24/00H04B17/00G06F11/26
Inventor 李陶亮
Owner 泰州市智谷软件园有限公司
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