Sine stripe projection device and three-dimensional profile measuring method
A projection device and sinusoidal stripe technology are applied in the field of three-dimensional profile measurement based on multi-wavelength sinusoidal stripe structured light projection, which can solve the problems of high price of three-dimensional profile measurement equipment and poor optical quality, and achieve low cost, high running speed, The effect of high measurement accuracy
Inactive Publication Date: 2012-07-18
SHANGHAI FUDAE INTELLIGENT SCI & TECH
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Problems solved by technology
[0003] The technical problem to be solved by the present invention is to overcome the defects of high price and poor optical quality of the three-dimensional profile measurement equipment in the prior art, and provide a high-speed, high-precision and low-cost sinusoidal fringe projection based on multi-wavelength sinusoidal fringe structured light projection Device and three-dimensional profile measurement method realized by using the sinusoidal fringe projection device
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[0023] Hereinafter, preferred embodiments of the present invention are given in conjunction with the drawings to illustrate the technical solutions of the present invention in detail.
[0024] In order to measure the three-dimensional profile of the measured object, especially to achieve high-speed and high-precision solder paste measurement in the electronic manufacturing SMT process, to effectively improve the quality of electronic assemblies, the present invention uses multi-wavelength sinusoidal fringe structured light irradiation On the surface of the measured object, because the three-dimensional surface shape of the measured object will spatially modulate the structured light illumination beam, this leads to the deformation of the structured light. When these deformations are observed through a camera from another perspective, the deformation data can be based on the deformation data. Realize the three-dimensional reconstruction of the surface shape of the measured object. ...
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The invention discloses a sine stripe projection device and a three-dimensional profile measuring method realized by using the sine stripe projection device. The method comprises the following steps of: (S1) correcting the intensity of each wavelength light emitted from the sine stripe projection device; (S2) acquiring the actual phase shift between every two wavelength stripes; (S3) marking the camera, and carrying out phase-height marking on the projection of each wavelength stripe in sequence; (S4) projecting each wavelength stripe to a measured object in sequence through the projection device, shooting each wavelength stripe projection image of the surface of the measured object through the camera, calculating out the initial phase of each measuring point through each wavelength stripe projection image, and unwrapping the initial phases; and (S5) respectively acquiring the height coordinate of each measuring point through the unwrapped initial phase of the measuring point according to the phase-height marking, and acquiring the three-dimensional coordinate of the measuring point through the camera marking. The measuring scheme has the advantages of high operating speed, high measuring precision and low cost.
Description
Technical field [0001] The invention relates to a sine fringe projection device and a three-dimensional profile measurement method realized by the sine fringe projection device, in particular to a three-dimensional profile measurement method based on multi-wavelength sine fringe structured light projection. Background technique [0002] In precise three-dimensional profile measurement, high-precision motors or precision projectors are commonly used in the industry to realize the phase shift between projections of different wavelength fringes. However, the above-mentioned equipment inevitably has various defects. For example, high-precision motors are expensive and have high assembly requirements, making it difficult to achieve mass production of the equipment; and precision projectors are not only expensive, but also have low light transmittance and are difficult to focus. . The above problems have seriously affected the wide application of precision three-dimensional profile me...
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IPC IPC(8): G01B11/25
Inventor 徐亦新李强盛鹏张栋黄豪
Owner SHANGHAI FUDAE INTELLIGENT SCI & TECH