Irradiation processing method and device of electron beam

Abstract

The invention discloses an irradiation processing method of an electron beam, which comprises the following steps of (a) providing a radiation perspective detecting device; (b) detecting by utilizing the radiation perspective detecting device to obtain the information of the quality thickness (dp) of an object to be subjected to irradiation processing; (c) providing an electron beam irradiation processing device; (d) regulating the energy (E) of the electron beam of the electron beam irradiation processing device by using a control device to ensure that the energy (E) of the electron beam is matched with the quality thickness (dp) of the object to be subjected to the irradiation processing; and (e) executing electron beam irradiation processing by utilizing the regulated electron beam irradiation processing device. According to the technical scheme, during the detecting step (b), the information of the object length (L) of an object to be subjected to irradiation processing is obtained at the same time by utilizing the radiation perspective detecting device. During the regulating detection step (d), the scanning width (W) of an electron beam subjected to the electron beam irradiation processing device is adjusted by means of the control device, so that the scanning width (W) of the electron beam is matched with the object length (L) of the object to be subjected to irradiation processing.

Description

technical field [0001] The invention relates to the field of radiation processing, especially the field of radiation processing using electron accelerators. More specifically, the present invention relates to a novel method and device for electron beam irradiation processing, which improves the efficiency of electron beam irradiation processing. Background technique [0002] An electron accelerator is a device used to accelerate charged particles to very high energies by using an electromagnetic field in a vacuum. Its core component is an accelerating tube that accelerates electrons. As a controllable ray source device, the electron accelerator has the advantages of high energy, high power, high efficiency, fast processing speed, and good safety performance in irradiation processing. At present, electron accelerators have been widely used in various fields such as preparation of polymer materials, food storage and preservation, radiation disinfection of medical supplies, ra...

AI Technical Summary

Problems solved by technology

If the mass thickness dρ of the irradiated object is too large, the electron beam will not be able to penetrate, the irradiation will be uneven, and the irradiation treatment effect will not be achieved; if the mass thickness dρ of the irradiated object is too small, most of the electron beam will pass through Inefficient use of the electron beam through the irradiated object

[0005] In the prior art, the irradiated objects are usually packaged products with a certain package, and the mass thickness dρ of the items inside the package can only be estimated simply on the average, and there is a lack of accurate measurement methods. As a result, the thickness of the irradiated object is usually controlled so that its mass thickness dρ is conservatively 10% to 15% smaller than the optimal mass thickness, which greatly affects the utilization efficiency of the electron beam

[0006] In addition, for irradiated objects with a certain package, the mass thickness dρ of the items inside the package can only be estimated simply on the average, and there is a lack of precise measurement methods, so that the composition and structure of the tested items cannot be identified

Therefore, it is impossible to accurately judge whether the inspected item is suitable for electron beam irradiation safety.

[0007] In addition, in addition to the mass thickness dρ of the inspected article in the thickness direction, which can only be estimated simply by average, there are also irradiated objects in the length direction of the inspected article, that is, along the conveying direction of the article conveying device The problem that the length cannot be optimally matched with the scan width of the accelerator

Similarly, in order to ensure the effect of irradiation processing, the scanning width of the accelerator will be larger than the estimated length of the irradiated object, so the utilization efficiency of the electron beam is also greatly affected

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