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Detection device and method for microcontroller system device

A microcontroller and detection device technology, applied in electrical testing/monitoring, etc., can solve problems such as high production costs, poor availability of aerospace-grade components, and long cycle times, and achieve low power consumption

Inactive Publication Date: 2011-02-09
NO 771 INST OF NO 9 RES INST CHINA AEROSPACE SCI & TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Its production cost is high and the cycle is long
Due to the embargo and other reasons, the availability of aerospace-grade components is poor, which often becomes a bottleneck restricting product development

Method used

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  • Detection device and method for microcontroller system device
  • Detection device and method for microcontroller system device
  • Detection device and method for microcontroller system device

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Experimental program
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Embodiment Construction

[0017] Such as figure 1 As shown, a detection device of a microcontroller system device includes a test circuit board part, an electric parameter test part, and a function test part. The electric parameter test part includes a power supply control 1 (power supply for the entire test circuit board, and a The power supply unit with power-off function), the current detection board 2 connected with the power supply control output; the test circuit board part includes a CPU to be tested 4, a memory to be tested 5 connected with the CPU to be tested bidirectional signal, two roads and the CPU to be tested output Connected bus interfaces 7 and 8 to be tested, one road and a 422 bus 9 connected to the output of the CPU to be tested, the CPU to be tested is also connected with a power supply and watchdog circuit 3 and a system start-up circuit 6, forming a set of test system; The output of the current detection board 2 is connected to the power supply and the watchdog circuit 3, and is...

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PUM

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Abstract

The invention discloses a detection device and a detection method for a microcontroller system device. The detection device comprises a test circuit board part, an electric parameter test part and a functional test part, wherein the electric parameter test part comprises power supply control and a current detection board connected with the output of the power supply control; the test circuit board part comprises a central processing unit (CPU) to be tested, a memory to be tested which is in bidirectional signal connection with the CPU to be tested, two bus interfaces to be tested which are connected with the output of the CPU to be tested and a 422 bus connected with the output of the CPU to be tested; the CPU to be tested is also connected with a power supply and watchdog circuit and a system oscillation starting circuit so as to form a set of test system; the output of the current test board is connected with the power supply and watchdog circuit and the functional test part; the functional test part is functional test equipment; and the input of the functional test part is connected with the output of the 422 bus and the outputs of the two bus interfaces to be tested.

Description

technical field [0001] The invention relates to a detection device and method, and is especially suitable for the detection device and method of industrial-grade micro-controller system components. Background technique [0002] Most of my country's existing microsatellites use aerospace-grade components. Aerospace-grade components include: V-level and S-level of MIL-PRF-38535 specification; S-level of MIL-M-38510 specification; K-level of MIL-PRF-38534 specification. The production of these components requires strict process technology Controlled, manufacturers who need to be listed in QML-38535 produce on their certified production lines, implement and pass all applicable requirements of the MIL-PRF-38535 specification or MIL-M-38510 specification (including qualification inspection, screening, TCI or QCI) , while also implementing the relevant “Aerospace Applications” requirements. Its production cost is high and the cycle is long. Due to the embargo and other reasons, ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G05B23/02
Inventor 张莹邱素蓉同志宏刘曦张天强李广平刘琦海涛
Owner NO 771 INST OF NO 9 RES INST CHINA AEROSPACE SCI & TECH