Member parallel test system and test method thereof
A test system and test method technology, applied in the direction of electronic circuit test, etc., can solve the problems of inconvenience, general products and methods without suitable structures and methods, etc., and achieve the effect of reducing total time, reducing equipment cost, and improving execution efficiency
Inactive Publication Date: 2011-03-23
ACCTON TECHNOLOGY CORPORATION
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Problems solved by technology
[0009] It can be seen that the above-mentioned existing component parallel testing system and its testing method obviously still have inconvenience and defects in product structure, manufacturing method and use, and need to be further improved urgently
In order to solve the above-mentioned problems, the relevant manufacturers have tried their best to find a solution, but no suitable design has been developed for a long time, and there is no suitable structure and method for general products and methods to solve the above-mentioned problems. This is obviously a problem that relevant industry players are eager to solve
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[0053] In order to further explain the technical means and effects that the present invention adopts to achieve the intended purpose of the invention, the following in conjunction with the accompanying drawings and preferred embodiments, the specific implementation, structure, The method, steps, features and effects thereof are described in detail below.
[0054] Please also refer to Figure 2A and Figure 2B as shown, Figure 2A It is a test system architecture diagram of an embodiment of the present invention, Figure 2B It is a block diagram of the test system of the embodiment of the present invention. The component parallel test system disclosed in the present invention includes a loading and unloading module 70, an instrument driver module 20, a first host (FirstPC) 31, a second host (Second PC) 41, a power meter (Power Meter) 21 and a Signal transceiver 22.
[0055] From Figure 2A It is known that the instrument driver module 20 is connected to the loading and un...
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The invention relates to a member parallel test system and a test method thereof. The member parallel test system comprises a power meter, a signal transceiver, a loading and unloading module, an instrument driving module, a first hot machine and a second host machine, wherein the instrument driving module provides a first authority for using the power meter and a second authority for using the signal transceiver, and controls the loading and unloading module to load and unload members at the first host machine and the second host machine, and the first host machine and the second host machine respectively request the first authority from the instrument driving module for using the power meter to carry out first test and request the second authority from the instrument driving module for using the signal transceiver to carry out second test when loading and unloading the members. The instrument driving module makes the first host machine and the second host machine parallelly execute the first test and the second test through controlling the giving modes of the first authority and the second authority. Through the invention, the equipment cost can be reduced, and the test efficiency of tested members can be maintained.
Description
technical field [0001] The present invention relates to a component parallel testing system and a testing method thereof, in particular to a component parallel testing system and a component parallel testing system which enables two testing hosts to perform two different stages of testing operations in parallel by controlling the timing and authority of an instrument drive module by loading and unloading components. its test method. Background technique [0002] In the prior art, after manufacturing the tested components, the manufacturer performs a test operation on each tested component. [0003] Please refer to figure 1 As shown, it is a block diagram of a component parallel test system in the prior art, which is composed of an instrument driver module 11 , a test host 12 , a power meter (Power Meter, PM) 15 and a signal transceiver 16 . Wherein, the test host 12 is connected to the instrument driver module 11 , and is connected to the power meter 15 and the signal tran...
Claims
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Inventor 骆文彬施云严刘一如
Owner ACCTON TECHNOLOGY CORPORATION