Member parallel test system and test method thereof

A test system and test method technology, applied in the direction of electronic circuit test, etc., can solve the problems of inconvenience, general products and methods without suitable structures and methods, etc., and achieve the effect of reducing total time, reducing equipment cost, and improving execution efficiency

Inactive Publication Date: 2011-03-23
ACCTON TECHNOLOGY CORPORATION
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  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0009] It can be seen that the above-mentioned existing component parallel testing system and its testing method obviously still have inconvenience and defects in product structure, manufacturing method and use, and need to be further improved urgently
In order to solve the above-mentioned problems, the relevant

Method used

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  • Member parallel test system and test method thereof
  • Member parallel test system and test method thereof
  • Member parallel test system and test method thereof

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[0053] In order to further explain the technical means and effects of the present invention to achieve the intended purpose of the invention, in conjunction with the accompanying drawings and preferred embodiments, the specific implementation, structure, The methods, steps, characteristics and effects are described in detail below.

[0054] Please also refer to Figure 2A versus Figure 2B As shown, Figure 2A Is an architecture diagram of a test system according to an embodiment of the present invention, Figure 2B It is a block diagram of a test system according to an embodiment of the present invention. The component parallel test system disclosed in the present invention includes a loading and unloading module 70, an instrument drive module 20, a first host (FirstPC) 31, a second host (Second PC) 41, a power meter (Power Meter) 21, and a Signal transceiver 22.

[0055] From Figure 2A It is known that the instrument driver module 20 is connected to the assembly and disassembly...

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Abstract

The invention relates to a member parallel test system and a test method thereof. The member parallel test system comprises a power meter, a signal transceiver, a loading and unloading module, an instrument driving module, a first hot machine and a second host machine, wherein the instrument driving module provides a first authority for using the power meter and a second authority for using the signal transceiver, and controls the loading and unloading module to load and unload members at the first host machine and the second host machine, and the first host machine and the second host machine respectively request the first authority from the instrument driving module for using the power meter to carry out first test and request the second authority from the instrument driving module for using the signal transceiver to carry out second test when loading and unloading the members. The instrument driving module makes the first host machine and the second host machine parallelly execute the first test and the second test through controlling the giving modes of the first authority and the second authority. Through the invention, the equipment cost can be reduced, and the test efficiency of tested members can be maintained.

Description

technical field [0001] The present invention relates to a component parallel testing system and a testing method thereof, in particular to a component parallel testing system and a component parallel testing system which enables two testing hosts to perform two different stages of testing operations in parallel by controlling the timing and authority of an instrument drive module by loading and unloading components. its test method. Background technique [0002] In the prior art, after manufacturing the tested components, the manufacturer performs a test operation on each tested component. [0003] Please refer to figure 1 As shown, it is a block diagram of a component parallel test system in the prior art, which is composed of an instrument driver module 11 , a test host 12 , a power meter (Power Meter, PM) 15 and a signal transceiver 16 . Wherein, the test host 12 is connected to the instrument driver module 11 , and is connected to the power meter 15 and the signal tran...

Claims

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Application Information

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IPC IPC(8): G01R31/28
Inventor 骆文彬施云严刘一如
Owner ACCTON TECHNOLOGY CORPORATION
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