Positioning system, lithographic apparatus and method
A positioning system and relative displacement technology, applied in microlithography exposure equipment, optomechanical equipment, printing equipment, etc., can solve the problems of increasing the flexibility of the substrate support structure and increasing the rigidity of the substrate support structure.
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[0019] figure 1 A lithographic apparatus according to an embodiment of the invention is schematically shown. The lithographic apparatus includes: an illumination system (illuminator) IL configured to condition a radiation beam B (e.g., ultraviolet (UV) radiation or any other suitable radiation); a patterning device support structure or a mask support structure ( For example a mask table) MT configured to support a patterning device (eg mask) MA and connected to a first positioning device PM configured to precisely position the patterning device MA according to determined parameters. The apparatus also includes a substrate table (e.g., wafer table) WT or "substrate support structure" configured to hold a substrate (e.g., a resist-coated wafer) W and configured for A second positioner PW for precisely positioning the substrate W is connected. The apparatus also includes a projection system (e.g. a refractive projection lens system) PS configured to project the pattern imparted...
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