Method for cleaning reaction cavity for growing films of compounds of group III elements and group V elements
A technology of thin film growth and reaction chamber, applied in gaseous chemical plating, metal material coating process, coating, etc., can solve the problems of reduced throughput, process quality deviation, inconsistent results, etc.
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[0056] As an embodiment, the aforementioned Cl-containing gas may be one or at least two mixed gases of HCl, Cl2, ClF, ClF3, ClF5, BCl3, and SiCl4.
[0057] As an embodiment, the aforementioned F-containing gas can be: one or at least two mixtures of ClF, ClF3, CCl2F2, ClF5, NF3, SF6, CF4, C2F6, C3F8, C4F6, C4F8, CHF3, CH2F2, NF3 gas.
[0058] The foregoing reaction chamber cleaning step is carried out under the environment of plasma action. The formation of this plasma can be as in figure 1 Formed within the device shown, the device 10 is formed by inductively coupling the plasma. When using the apparatus 10 to clean the accumulation of deposits in the reaction chamber, the substrate W has been removed from the substrate holder 17 inside the reaction chamber (the substrate W is indicated by a dotted line in the figure). When performing cleaning, a cleaning gas 40b is introduced into the interior of the reaction chamber 18 first. Preferably, the composition of the cleaning ...
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