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Method for monitoring analog voltage based on IEEE1149.4

An IEEE1149.4, mode technology, applied in the field of board-level circuit testability design, can solve the problems of limited I/O pins, increase of PCB board components, etc., to reduce the number, reduce wiring, and improve testability design horizontal effect

Inactive Publication Date: 2011-07-20
BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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Problems solved by technology

However, this solution will add more wiring, and the vacant I / O pins on the edge connector are limited. When there are many test points, additional edge connectors need to be added, resulting in an increase in the number of components on the PCB.

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  • Method for monitoring analog voltage based on IEEE1149.4
  • Method for monitoring analog voltage based on IEEE1149.4
  • Method for monitoring analog voltage based on IEEE1149.4

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Embodiment Construction

[0023] In June 1999, IEEE 1149.4, the mixed-signal test bus standard, was released to provide a relatively simple ability to find shorts, opens, and misassembled analog components in mixed-signal circuits. A chip conforming to the IEEE 1149.4 standard (hereinafter referred to as the IEEE 1149.4 chip) has a test access data external bus, an analog boundary module (ABM), a test bus interface circuit (TBIC), a controller, and an internal AB1 / AB2 bus. IEEE 1149.4 chips have their own functions, such as STA400 (the core function of which is an analog channel selector with double-two-choice or single-four-choose one), etc. When the test mode is selected, it can realize the monitoring of an external voltage signal without affecting normal operation of the circuit.

[0024] The present invention applies the boundary scan technology and utilizes the boundary scan unit in the IEEE 1149.4 chip to realize the multi-point analog voltage monitoring function.

[0025] The present invention ...

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Abstract

The invention discloses a method for monitoring analog voltage based on IEEE1149.4, wherein the method comprises the following steps of: accessing a chip in accordance with the IEEE1149.4 standard into a boundary scan chain of a circuit board according to a boundary scan link construction method designed by the circuit board; connecting a detection point voltage signal in the circuit board to pins which are provided with analog boundary modules ABM on the chip; connecting a functional pin AT2 of the chip to an output port of a boundary connector; when monitoring the voltage, setting the ABM corresponding to the current detection point in the chip in a P1 mode, namely, monitoring the pin state by an AB2 bus, and setting other ABMs in a P0 mode; setting a test bus interface circuit TBIC in a P1 or a P3 mode, namely connecting the AB2 bus to the AT2; and observing the voltage of the detection point through the AT2 pin. The method of the invention is capable of detecting the analog voltage of many test points without adding too many connecting wires and components.

Description

technical field [0001] The invention belongs to the technical field of testability design of board-level circuits, and in particular relates to an analog voltage monitoring method based on IEEE1149.4. Background technique [0002] With the improvement of chip integration and complexity, especially the emergence of boundary scan technology, "physical probes" are gradually being replaced by "virtual probes". The Boundary Scan mechanism provides a complete, standardized approach to design for testability. Since the emergence of the boundary-scan standard, the number of chips and design and development software supporting the boundary-scan mechanism on the market has increased day by day, and its application has become more and more extensive. In particular, the use of boundary-scan technology in digital circuit boards is maturing. [0003] However, quite a lot of circuits in the PCB board belong to the situation where digital signals and analog signals are mixed. The monitori...

Claims

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Application Information

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IPC IPC(8): G01R31/28G01R31/3185
Inventor 杜影徐鹏程王石记安佰岳
Owner BEIJING AEROSPACE MEASUREMENT & CONTROL TECH
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