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Multi inductively coupled plasma reactor and method thereof

A technology of coupling plasma and plasma, applied in the field of plasma reactor, can solve the problem that the plasma does not uniformly process the central area and the peripheral area, etc.

Inactive Publication Date: 2011-08-24
ACN CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0007] In addition, due to the large-scale substrate to be processed, there arises a problem that the central region and the peripheral region in the substrate to be processed are not uniformly processed by the plasma
That is, since plasma is intensively formed in the central region of the substrate to be processed as compared with the peripheral region, a difficulty arises in completely and uniformly processing the substrate to be processed

Method used

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  • Multi inductively coupled plasma reactor and method thereof
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  • Multi inductively coupled plasma reactor and method thereof

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Embodiment Construction

[0047] In order to fully understand the many objects accomplished by the various embodiments and operating advantages of the present invention, preferred embodiments of the present invention will be described in more detail with reference to the accompanying drawings. In the drawings, the same elements will be denoted by the same reference numerals. In addition, detailed technical descriptions of known functions and constructions will be omitted herein so as not to obscure the subject matter of the present invention.

[0048] figure 1 is a cross-sectional view of a plasma processing apparatus according to a preferred embodiment of the present invention, in which a central plasma source and a peripheral plasma source are separated from each other.

[0049] refer to figure 1 , the multiple inductively coupled plasma reactor 10 according to the preferred embodiment of the present invention is constructed by a reactor body 11 , a central plasma source 20 and a peripheral plasma ...

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Abstract

Disclosed is a multi-inductively coupled plasma reactor and method thereof. In a multi-inductively coupled plasma reacting method, an etching method to increase a specific portion of a substrate to be processed includes etching a specific portion of a substrate to be processed; and depositing a passivation layer on a surface of the specific portion etched, wherein the etching and depositing steps are repeatedly proceeded, and one of both steps is executed when there is plasma formed by a central plasma source and a peripheral plasma source. According to the multi-inductively coupled plasma reactor and method thereof of the invention, it is possible that plasma is uniformly processed on the entire area of the substrate since the central plasma source and the peripheral source are provided separately. Further, it is possible to form an independent multiple plasma area without electrical interference in the plasma reactor using the interference prevention electrode grounded between the central plasma source and the peripheral plasma source. Further, the plasma formed by the central plasma source and the peripheral plasma source is used to deeply etch a specific portion of the substrate to be processed.

Description

technical field [0001] The present invention relates to multiple inductively coupled plasma reactors and methods thereof, and in particular, to a method of using multiple inductively coupled plasmas to etch back a specific portion of a substrate to be processed. Background technique [0002] In the anisotropic etching method of silicon, a process of etching a specific portion in a substrate to be processed and depositing a passivation layer on the etched specific portion is repeatedly performed. While the etching and deposition processes are repeatedly performed, a specific portion of the substrate to be processed is etched to a desired depth. This etching and deposition process is achieved by plasma. [0003] A plasma is a highly ionized gas that includes equal numbers of positive ions and electrons. A plasma discharge is used to excite the gas to produce an activated gas comprising ions, free radicals, atoms and molecules. That is, activated gases are widely used in var...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): H01L21/00H01J37/32
CPCH01J37/32165H01J37/32449H01J37/321H01J37/3211
Inventor 许鲁铉金奎东南昌祐朴成民崔大圭
Owner ACN CO LTD
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