Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Light-emitting diode (LED) dynamic scan driving circuit capable of preventing current from overshooting

A light-emitting diode and dynamic scanning technology, which is applied in the direction of electric lamp circuit layout, electric light source, light source, etc., can solve problems such as current overshoot, achieve the effect of improving gray scale, improving display effect, and reducing power consumption

Active Publication Date: 2013-10-02
SUZHOU YONGJIAN PHOTOELECTRIC TECH
View PDF4 Cites 0 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0016] The invention provides a light-emitting diode dynamic scanning drive circuit that prevents current overshoot, which solves the problem of severe current overshoot that occurs when the row selection tube in the LED load circuit is switched from the cut-off state to the conduction state, and reduces the cost of LED products. power consumption, and effectively protects the drive circuit

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Light-emitting diode (LED) dynamic scan driving circuit capable of preventing current from overshooting
  • Light-emitting diode (LED) dynamic scan driving circuit capable of preventing current from overshooting
  • Light-emitting diode (LED) dynamic scan driving circuit capable of preventing current from overshooting

Examples

Experimental program
Comparison scheme
Effect test

Embodiment 1

[0038] Such as image 3 and Figure 4 As shown, a light emitting diode dynamic scanning drive circuit for preventing current overshoot includes an LED load circuit 2, a constant current drive output circuit 1 connected to the LED load circuit 2, and an overshoot measurement and control circuit 3 connected to the constant current drive output circuit 1 .

[0039] The constant current drive output circuit 1 consists of an operational amplifier AMP1, a switch unit SW, and a constant current tube M 0 , adjusting tube M 1 , Composed of resistance R0.

[0040] The positive input terminal of the operational amplifier AMP1 is connected to the reference voltage V ref1 , the negative input terminal of the operational amplifier AMP1 is connected to the adjustment tube M 1 The source d of the operational amplifier AMP1 is connected to the adjustment tube M through the two-choice switch unit SW 1 The grid b and achieve negative feedback impedance adjustment, forcing the constant curr...

Embodiment 2

[0052] Such as Figure 5 As shown, a light emitting diode dynamic scanning drive circuit for preventing current overshoot includes an LED load circuit 2, a constant current drive output circuit 1 connected to the LED load circuit 2, and an overshoot measurement and control circuit 3 connected to the constant current drive output circuit 1 .

[0053] Constant current drive output circuit 1 is composed of operational amplifier AMP1, switch tube M k , Constant current tube M 0 , adjusting tube M 1 And constant current CMOS transmission gate K composition.

[0054] The positive input terminal of the operational amplifier AMP1 is connected to the reference voltage V ref1 , the negative input of the operational amplifier AMP1 is connected to the constant current tube M 0 The drain of the operational amplifier AMP1 is connected to the adjustment tube M 1 The grid b and achieve negative feedback impedance adjustment, forcing the constant current tube M 0 The drain voltage is eq...

Embodiment 3

[0066] Such as Figure 6 As shown, a light emitting diode dynamic scanning drive circuit for preventing current overshoot includes an LED load circuit 2, a constant current drive output circuit 1 connected to the LED load circuit 2, and an overshoot measurement and control circuit 3 connected to the constant current drive output circuit 1 .

[0067] Constant current drive output circuit 1 is composed of operational amplifier AMP1, switch tube M k , Constant current tube M 0 , adjusting tube M 1 And constant current CMOS transmission gate K composition.

[0068] The positive input terminal of the operational amplifier AMP1 is connected to the reference voltage V ref1 , the negative input of the operational amplifier AMP1 is connected to the constant current tube M 0 The drain of the operational amplifier AMP1 is connected to the adjustment tube M 1 The grid b and achieve negative feedback impedance adjustment, forcing the constant current tube M 0 The drain voltage is eq...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a light-emitting diode (LED) dynamic scan driving circuit capable of preventing current from overshooting. The driving circuit provided by the invention comprises an LED load circuit, a constant-current driving output circuit connected with the LED load circuit and an overshooting measurement and a control circuit connected with the constant-current driving output circuit. According to the invention, the overshooting measurement and control circuit is utilized to detect a state of the LED load circuit when the closure of all row selection pipes and the opening of constant-current output channels are carried out simultaneously; the constant-current output channels are closed or enter into a high-resistance conducting state before the row selection pipes are conducted; and the constant-current output channels are turned back to a normal constant-current output state after the row selection pipes are conducted, thus the problem of serious current overshooting occurred when the row selection pipes are changed into the conducting state from the closed state is effectively eliminated, the driving circuit is effectively protected, the display effect of LED dynamic scan driving application is improved, the gradation of grey is greatly enhanced, and the cost and power consumption of LED products are reduced.

Description

technical field [0001] The invention belongs to the technical field of integrated circuits, and in particular relates to a light-emitting diode (LED) dynamic scanning drive circuit for preventing current overshoot. Background technique [0002] In the application of LED display, backlight and lighting, with the improvement of LED luminous efficiency, and the promotion of the demand for reducing power consumption and cost, the driving mode of LED has been expanded from static scanning driving mode to dynamic scanning driving mode. The so-called static scanning method refers to the "point-to-point" application in which the constant current output channel of the driver chip directly drives the LED, while the dynamic scanning method refers to the "point-to-column" application of the driver chip and the row control circuit using the persistence of vision of the human eye. Each column of constant current output channels time-sharing drives multi-point LEDs. Commonly used dynamic ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Patents(China)
IPC IPC(8): H05B37/02
CPCY02B20/42Y02B20/40
Inventor 赵轶唐尧何乐年
Owner SUZHOU YONGJIAN PHOTOELECTRIC TECH
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com