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LED (Light Emitting Diode) ageing detection screening equipment and method

The technology of screening equipment and splint is applied in the field of LED aging detection screening equipment and its detection and screening. Simple and novel structure, improved detection efficiency and detection quantity

Active Publication Date: 2011-09-07
JIANGMEN JIANGHAI DISTRICT KAIHUI PHOTOELECTRIC EQUIP CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

However, there is no special device suitable for LED aging detection. The traditional method is to use manual testing to perform aging tests on each LED, and this method of detection is not only harmful to the eyes of the testing workers. Moreover, the detection efficiency is very low. Based on 8 hours of work per day, each worker detects up to 5,000 LEDs per day, and manual detection will easily bend the positive and negative pins of the LED when it is pulled out, which will affect the quality of the product.
[0003] In view of the above existing situation, the applicant has been committed to how to improve the research and development of LED aging detection and screening equipment. In the process of continuous testing and practice, he finally developed a simple, fast and efficient LED aging Detect and screen equipment in order to eliminate problematic LEDs with hidden electrical and process hazards

Method used

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  • LED (Light Emitting Diode) ageing detection screening equipment and method
  • LED (Light Emitting Diode) ageing detection screening equipment and method
  • LED (Light Emitting Diode) ageing detection screening equipment and method

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Embodiment 2

[0032] This embodiment 2 is changed on the basis of embodiment 1, which basically increases the setting of the positive contact piece 14 and the second positive contact piece 15 on the basis of embodiment 1, specifically: as Figure 4 As shown, the splint is also provided with an elastic positive contact piece with the same structure as the negative contact piece, the positive contact piece corresponds to the positive pin of the LED, and the splint is provided with a second positive contact piece corresponding to the positive contact piece. Because the positive current and voltage input by the first positive contact to each LED are different, there are different strengths, and the function of the positive contact and the second positive contact is to increase the current and voltage input to the positive pin of the LED. , to ensure the stability of its current and voltage, and sufficient LED luminosity. Likewise, the positive contact strip does not touch the negative pin of th...

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Abstract

The invention discloses LED (Light Emitting Diode) ageing detection screening equipment and method. In the equipment, a push rod is driven by a power device to make each splint press towards a corresponding LED row and a corresponding LED cathode pin is in contact with a corresponding cathode contact, so that electrification of LEDs is realized; meanwhile, detection screening of the LEDs is realized by using a PC (Personal Computer) machine. In the entire ageing process, rated voltage output by a circuit control system is kept at 24V, the rated current output is 50mA, current and voltage input to the LEDs are adjustable, and the rated current and rated voltage are supplied to the ageing of the LEDs for 20-60 minutes; through ageing, LEDs with electrical and process hidden troubles can be eliminated; and after ageing, the power device stops acting on the push rod and each splint returns to an initial position under the action of the acting force of a return spring, so that detection ofLEDs is realized and defective LEDs are eliminated.

Description

technical field [0001] The present invention relates to an aging detection and screening device dedicated to LEDs and a detection and screening method thereof, in particular to a detection and screening device and method for eliminating LEDs with hidden electrical and process hazards through LED aging. Background technique [0002] At present, there is no equipment that can effectively predict and detect the performance failure of LEDs, and the general detection is handled by traditional methods. Generally speaking, LED aging is to use a high-voltage withstand driving method to apply a driving voltage higher than the normal driving voltage to the LED. This method is to apply a voltage higher than the multiple voltages required to drive the LED to the LED, and Provides withstand tests for LEDs. The high-voltage withstand driving method test can improve the ability to detect circuit defects in open-circuit LEDs at an applied voltage level. The high voltage withstand driving ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): B07C5/344G01R31/26
Inventor 陈业宁
Owner JIANGMEN JIANGHAI DISTRICT KAIHUI PHOTOELECTRIC EQUIP CO LTD
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