Method for correcting LED (light emitting diode) crystal grain production facility
A calibration method and technology for production equipment, which can be applied to electrical components, optical performance testing, single semiconductor device testing, etc., can solve the problems of heavy workload and difficulty in drawing and correcting the curve fitting between the dominant wavelength and light intensity of the testing machine, etc. Achieve the effect of reducing workload, saving manpower, and good consistency
Inactive Publication Date: 2012-12-05
XIANGNENG HUALEI OPTOELECTRONICS
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Problems solved by technology
[0005] The purpose of the present invention is to provide a calibration method for LED grain production equipment to solve the problems of difficulty in drawing and calibration curve fitting of the dominant wavelength and light intensity of the testing machine and heavy workload in the prior art
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[0030] A calibration method for LED grain production equipment, comprising the following steps:
[0031] 1. Prefabricate 100-200 grains; after testing, select 40-60 grains with different dominant wavelengths and light intensities, and package them to obtain the prepared grains; test the electrical properties of the prepared grains, and the selected electrical properties are accurate Stable and correct grains.
[0032] 2. Use the standard machine to test the characteristic data x of each calibrated grain; use the production machine to test the characteristic data y of each calibrated grain; fit the characteristic curve according to the characteristic data obtained by each calibrated grain, and according to the characteristic curve Adjust the operating parameters of the production machine so that the characteristic curve of each calibration grain satisfies the linear equation y=mx+b, where m is 0.8-1; the characteristic data include dominant wavelength data and light intensity d...
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Abstract
The invention discloses a method for correcting an LED (light emitting diode) crystal grain production facility. The correcting method comprises the following steps: manufacturing a plurality of correction crystal grains; testing characteristic data x of each correction crystal grain by adopting a standard machine; testing characteristic data y of each correction crystal grain by adopting the production machine; fitting a characteristic curve according to the characteristic data obtained by each correction crystal grain, and regulating operation parameters of the production machine according to the characteristic curve, thus the characteristic curve of each correction crystal grain meets the linear equation y=mx+b, wherein m is between 0.8 and 1, and the characteristic dada comprises dominant wavelength and light intensity data. By applying the technical scheme provided by the invention, the work amount is reduced greatly, the working efficiency is improved, and the product data has good consistence.
Description
technical field [0001] The invention relates to the technical field of optoelectronic device testing, in particular to a calibration method for LED grain production equipment. Background technique [0002] In view of the fact that the LED packaging application side has a preference for the performance of LED chips used in different products, before the LED chips are shipped, it is necessary to spot-test the characteristics of the grains on the wafer, and then classify them according to the characteristics, and then sell them by grade. During the test, it is necessary to spot-measure the electrical data and optical rotation data of the crystal grains. Among them, the electrical data can meet the measurement requirements in production as long as the power supply and measurement facilities used in the machine are calibrated and stable. However, the optical activity part involves many factors, such as different chip manufacturing processes, differences in the materials used in ...
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Login to View More IPC IPC(8): H01L33/00G01R31/26G01M11/02
Inventor 姜敏李蛟徐亚兵
Owner XIANGNENG HUALEI OPTOELECTRONICS