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Multifunctional probe bench test system used for radiation experiment of x-ray and gamma-ray

A technology of multi-function probe and test system, applied in electronic circuit test, non-contact circuit test, measurement of electricity and other directions, can solve problems such as inability to be directly applied, and achieve the effect of high safety and high cost performance

Active Publication Date: 2011-10-26
XIAN JIAOTONG LIVERPOOL UNIV
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  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The purpose of the present invention is to provide a multifunctional probe station testing system that can be used for X-ray and gamma-ray radiation experiments, which solves the technical problem that the existing equipment in the prior art cannot be directly applied to X-ray and gamma-ray radiation experiments

Method used

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  • Multifunctional probe bench test system used for radiation experiment of x-ray and gamma-ray
  • Multifunctional probe bench test system used for radiation experiment of x-ray and gamma-ray
  • Multifunctional probe bench test system used for radiation experiment of x-ray and gamma-ray

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Embodiment

[0029] Such as Figure 1 to Figure 4 As shown, the multifunctional probe station test system that can be used for X-ray and gamma-ray radiation experiments includes a probe test platform and a radiation protection dark box 5, and the probe test platform includes a chip to be tested 1 and a built-in radioactive source 3. A lead container 4 and a microscope 2 for observing changes in the chip to be tested, the probe test platform is arranged in a radiation protection dark box 5, the upper end of the lead container is open, the chip to be tested 1 is placed on the opening of the lead container, the chip to be tested 1. A probe base 8 is provided at the upper end; a spatial position adjustment device for adjusting the spatial position of the chip 1 to be tested is provided at the lower end of the lead container.

[0030] The microscope is connected to the computer through the electronic eyepiece 6; the chip image observed by the microscope is displayed and output to the computer t...

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Abstract

The invention discloses a multifunctional probe bench test system used for radiation experiment of x-ray and gamma-ray. The system comprises a probe test platform and a radiation protection camera obscura (5). The probe test platform comprises a chip to be measured (1), a lead container (4) with a built-in radioactive source (3) and a microscope (2) which is used to observe changes of the chip to be measured. The probe test platform is arranged in the radiation protection camera obscura (5). An upper end of the lead container is opened and the chip to be measured (1) is arranged on the opening of the lead container. A probe seat (8) is arranged above the chip to be measured (1). A space position adjusting device, which is used to adjust the space position of the chip to be measured (1), is arranged on the bottom of the lead container. The system possesses a test function of the common probe bench. A photon radiation chip test can be conveniently and safely realized by using the system.

Description

technical field [0001] The invention belongs to the technical field of radiation testing, and relates to a testing device for semiconductor materials and device performance, in particular to a multifunctional probe station testing system that can be used for X-ray and gamma-ray radiation experiments. Background technique [0002] The semiconductor industry is the mainstay of today's industry. With the development of aerospace microelectronics and military microelectronics technology, various semiconductor materials and devices have been widely developed and used in aerospace vehicles and nuclear control systems. However, in particular, these microelectronic devices are exposed to strong radiation environments, such as space radiation, artificial radiation. Radiation effects can affect their reliability, leading to the failure of parts or even the entire electronic system. Therefore, in order to make these special microelectronic devices work normally and stably in the hars...

Claims

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Application Information

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IPC IPC(8): G01R31/303G01R1/02
Inventor 归靖慷赵策洲胡新立
Owner XIAN JIAOTONG LIVERPOOL UNIV
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