Method for extracting parameters of bipolar transistor and equivalent circuit of bipolar transistor
A bipolar transistor, parameter extraction technology, applied in the field of microelectronics, to overcome the DC and low-frequency characteristics, the effect of accurate reflection
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[0047] Attached below figure 1 , the method of the present invention will be further described.
[0048] Step 1. DC Test
[0049] 1a) Use a semiconductor analyzer to test the common emission current output curve of the bipolar transistor. The test method is to ground the emitter of the bipolar transistor and apply a current to the base, the range is 10uA ~ 50uA, the step size is 10uA, and the collector is applied. Voltage, the range is 0V~5V, the step size is 1V, and the current of the collector is measured;
[0050] 1b) Use a semiconductor analyzer to test the forward Gepan curve of the bipolar transistor. The test method is to ground the emitter of the bipolar transistor, short-circuit the base and collector, and apply a voltage to the base, in the range of 0.8V to 1.3 V, measure the base and collector currents;
[0051] 1c) Use a semiconductor analyzer to test the reverse Gopan curve of the bipolar transistor. The test method is to ground the collector of the bipolar tra...
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