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Method for extracting parameters of bipolar transistor and equivalent circuit of bipolar transistor

A bipolar transistor, parameter extraction technology, applied in the field of microelectronics, to overcome the DC and low-frequency characteristics, the effect of accurate reflection

Active Publication Date: 2011-11-23
陕西半导体先导技术中心有限公司
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  • Summary
  • Abstract
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  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

The disadvantage of this method is that it can only fit the equivalent circuit parameters of one operating point of bipolar transistors, and the equivalent circuit of bipolar transistors established based on this method can only reflect the device characteristics of one operating point of bipolar transistors

Method used

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  • Method for extracting parameters of bipolar transistor and equivalent circuit of bipolar transistor
  • Method for extracting parameters of bipolar transistor and equivalent circuit of bipolar transistor
  • Method for extracting parameters of bipolar transistor and equivalent circuit of bipolar transistor

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Experimental program
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Effect test

Embodiment Construction

[0047] Attached below figure 1 , the method of the present invention will be further described.

[0048] Step 1. DC Test

[0049] 1a) Use a semiconductor analyzer to test the common emission current output curve of the bipolar transistor. The test method is to ground the emitter of the bipolar transistor and apply a current to the base, the range is 10uA ~ 50uA, the step size is 10uA, and the collector is applied. Voltage, the range is 0V~5V, the step size is 1V, and the current of the collector is measured;

[0050] 1b) Use a semiconductor analyzer to test the forward Gepan curve of the bipolar transistor. The test method is to ground the emitter of the bipolar transistor, short-circuit the base and collector, and apply a voltage to the base, in the range of 0.8V to 1.3 V, measure the base and collector currents;

[0051] 1c) Use a semiconductor analyzer to test the reverse Gopan curve of the bipolar transistor. The test method is to ground the collector of the bipolar tra...

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Abstract

The invention discloses a method for extracting parameters of a bipolar transistor and an equivalent circuit of the bipolar transistor. The method comprises the following steps: performing direct current test and S parameter test on the bipolar transistor; and performing curve fitting by use of ADS (Application Development System) software and origin software so as to acquire parameters of the bipolar transistor. The equivalent circuit established based on the method for extracting the parameters of the bipolar transistor comprises three inductors, five capacitors, six resistors and an intrinsic module BJT (Bipolar Junction Transistor), wherein the intrinsic module BJT comprises two resistors, three charge controls and three current controls. The method can be used for establishing bipolar transistor equivalent circuits suitable for circuits in different conditions, and also can be used for establishing the bipolar transistor equivalent circuit for high-frequency circuits. The bipolartransistor equivalent circuit established based on the method can reflect the device characteristics of a group of working points of the bipolar transistor, and can be used for circuit simulation of different situations; and the equivalent circuit can reflect the high frequency characteristic of the bipolar transistor, and can be used for high frequency circuit simulation.

Description

technical field [0001] The invention belongs to the technical field of microelectronics, and further relates to a method for extracting parameters of bipolar transistors in the technical field of semiconductor devices and an equivalent circuit thereof. This method can be used to extract the parameters of bipolar transistors, and the equivalent circuit of bipolar transistors established by this method can be used to build circuits and simulate actual circuits. Background technique [0002] At present, in the field of semiconductor devices, there are two commonly used bipolar transistor parameter extraction methods: one is to extract parameters through the size and structure of bipolar transistors, and the other is to use the DC and AC parameters of bipolar transistors. Test for parameter extraction. Commonly used bipolar transistor equivalent circuits are GP equivalent circuits and VBIC equivalent circuits. [0003] Shanghai Huahong NEC Electronics Co., Ltd. discloses a bip...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F17/50H01L29/73
Inventor 吕红亮杨实张玉明张义门张金灿许俊瑞项萍张晓鹏
Owner 陕西半导体先导技术中心有限公司
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