Integrated Circuit Test Methods

Abstract

An integrated circuit testing method includes providing an integrated circuit testing system with a voltage supply and a plurality of control channels. A first switch element is connected between the voltage supply and a first integrated circuit, and a second switch element is connected between the voltage supply and the second integrated circuit. The switching element may comprise, for example, an electromagnetic relay. The relay can be controlled by the corresponding test system control channel to selectively provide power to each integrated circuit.

Description

technical field [0001] The present invention relates to the testing of an integrated circuit, and in particular to the testing of a memory element. Background technique [0002] The fabrication of integrated circuits involves processing a chip through a series of fabrication steps to create multiple integrated circuits on the chip. Once the chip manufacturing process is completed, the chip is diced into individual integrated circuits, and then these individual integrated circuits go through different wire bonding and packaging steps. Before these integrated circuits are used, however, it is desirable to be able to test the operation of these integrated circuits. In some cases, integrated circuits may be tested prior to die dicing. Alternatively, the integrated circuit can be tested after the wire bonding and packaging steps. Generally, these tests are done to verify the different electrical properties of integrated circuits. The information obtained from the tests can be...

AI Technical Summary

Problems solved by technology

[0004] This test is a time consuming process as the integrated circuits are tested individually

Images