Automatic information identification system of optical detection etalon

Abstract

The invention discloses an automatic information identification system of an optical detection etalon, which relates to the technical field of a measuring unit. The system comprises a plurality of radio frequency identification device (RFID) chips, an RFID reader and a computer, wherein the RFID chips are arranged in each optical etalon required by optical detection and correspondingly store the sequence number information of the etalon; the RFID reader is connected with a computer; when the optical etalon which is integrated with the RFID chip is installed on an interferometer host, the RFID reader reads sequence number information in the RFID chip; the detailed information of the optical etalon corresponding to the sequence number is found from an etalon database stored by the computer; required parameters are led into relevant processing software; and meanwhile, parameter supplementary analysis is combined to select an optimal etalon. According to the automatic information identification system of the optical detection etalon, optical detection efficiency and measurement precision are improved, and the requirements on the technical level of inspection personnel can be lowered.

Description

technical field [0001] The invention belongs to the technical field of measuring devices, and relates to an automatic identification system for optical detection etalon information, which is used for precise and fast optical detection. Background technique [0002] Optical devices such as optical lenses are widely used in the national economy, and optical detection technology directly affects the final performance of optical devices such as optical lenses. [0003] At present, in the process of optical detection, on the one hand, it is often necessary to input the parameters of the optical etalon. Simple detection requires the input of the optical F-number and aperture of the etalon, etc., while precise detection requires the input of complex zero optical path adjustment parameters, surface shape parameters, etc. At present, they are all manually input or read, and there are problems such as low input efficiency and low accuracy, which seriously reduces the efficiency of opt...

AI Technical Summary

Problems solved by technology

[0005] In order to solve the problems of low efficiency and low accuracy of existing optical detection and high technical level requirements for optical detection personnel, the purpose of the present invention is to provide an automatic identification system for optical detection etalon information, which is based on RFID radio frequency identification Technology, using passive devices, greatly reduces electromagnetic interference; stores a large amount of information, automatically reads a variety of optical etalon parameters, and improves detection efficiency; assists in the selection of optical etalons, reducing the technical requirements for operators

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