Schottky barrier metal oxide semiconductor (MOS) transistor and preparation method thereof
A technology of MOS transistor and Schottky potential, applied in the field of Schottky barrier MOS transistor and its preparation, can solve the problems of large on-current, large on-current of devices, etc., so as to improve the on-current and the on-state. current, the effect of increasing the on-state current
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Embodiment 1
[0044] Adopt the following method to prepare the MOS transistor of the present invention:
[0045] (1) On the bulk silicon wafer silicon substrate 1 with the crystal orientation of (100), the shallow trench isolation technology is used to fabricate the active region isolation layer, and the doping concentration of the substrate is N-type lightly doped; then, a step pattern is formed by photolithography , etch a step structure, the step height is about 500nm, such as figure 1 (a), 1(b);
[0046] (2) thermally grow the gate dielectric layer, and then deposit the gate electrode layer, the gate dielectric layer is SiO 2 , the thickness is 1-5nm, the gate electrode layer is a highly doped polysilicon layer, the thickness is about 200nm, such as figure 2 (a), as shown in 2(b);
[0047] (3) The ring-shaped gate electrode 3 is formed by using the sidewall process, and the thickness of the gate electrode is about 200nm, such as image 3 (a), 3(b);
[0048] (4) Deposit the side wa...
Embodiment 2
[0053] As in Example 1, the difference is:
[0054] The step height in step (1) is about 200nm;
[0055] The thickness of the gate electrode in steps (2) and (3) is about 100nm;
[0056] The thickness of the sidewall in steps (4) and (5) is about 50nm;
[0057] ●The sputtered metal in step (6) is a metal with a smaller hole Schottky barrier, such as Pt.
Embodiment 3
[0059] As in Example 1, the difference is:
[0060] The substrate doping in step (1) is P-type lightly doped;
[0061] ●The sputtered metal in step (6) is a metal with a small electronic Schottky barrier, such as rare earth metal Er or Yb.
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